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Tektronix Introduces Fully Automated Test Support for SAS Conformance TekExpress Now Offers a Simplified, One-Button Solution that Spans both SATA and SAS Standards, Saving Time and Improving Accuracy (WebID: 16642)	27-Jan-2010
Tektronix to Deliver Technical Broadcast Seminar Series at Broadcast Video Expo 2010 World-Class Experts Will Share Technical Expertise to Help Broadcast Professionals Prosper in the File-Based, HD World (WebID: 16643)	26-Jan-2010
Tektronix SuperSpeed Test Solution Supports World’s First USB 3.0 Certification At NEC Electronics Tektronix Receiver Test Solution Helps Bring USB 3.0 Compatible Devices To Market Faster (WebID: 16576)	18-Jan-2010
Tektronix Oscilloscopes Win 2009 EFY Readers’ Choice Award for Sixth Consecutive Year Recognizing Industry Leading Specifications, Applications Support and Ease-of-Use (WebID: 16593)	15-Jan-2010
Tektronix Spectrum Analyzer Makes Hot 100 List RSA6120A Spectrum Analyzer Chosen as a “Hot 100” Electronic Product of 2009 by EDN Magazine (WebID: 16568)	14-Jan-2010
Tektronix Spectrum Analyzer Receives “Best of Test” 2009 Honor Editors at Electronic Design Magazine Choose the RSA6120A Spectrum Analyzer for 2009 “Best of Test” Award (WebID: 16567)	13-Jan-2010
Tektronix Named Finalist for "Best in Test" 2010 Awards MSO70000 Mixed Signal Oscilloscope Receives Nomination for Test & Measurement World "Best in Test” Awards; Now in Running for 2010 Test Product of the Year (WebID: 16566)	12-Jan-2010
Tektronix Delivers USB 2.0 Bus Analysis Solutions for the Embedded Design Engineer New Module Delivers Packet-level Automatic Trigger, Decode and Search for Bench Oscilloscopes (WebID: 16432)	09-Dec-2009
Tektronix Wins 2009 EEPW Magazine Editor's Choice Award MSO2000 Mixed Signal Oscilloscope Selected as “Embedded System Users’ Favorite Test and Measurement Solution” (WebID: 16464)	08-Dec-2009
Tektronix Enhances Market-Leading DDR Test and Validation Portfolio with Two New Additions New Capabilities Include DDR3-1867 Memory Bus Data Capture & Analysis for TLA7000 Logic Analyzers and Industry’s First LP-DDR2 Test and Validation (WebID: 16439)	30-Nov-2009

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