Features
& Benefits
- DC to 70+ GHz Bandwidth*1
- Exceptional
Trigger Jitter and Horizontal Timebase Stability
- Modular Architecture
- Up
to Eight Channels Acquisition
- High Resolution and Measurement Repeatability
- Comprehensive,
Accurate, Automatic Measurement System
- Intuitive User Interface
- Large
Display (10.4 in.)
- Microsoft Windows-based Graphical User Interface
- Windows
2000 for enhanced network security
Applications
- Semiconductor
Testing
- Impedance and Crosstalk Characterization (using TDR)
- High-speed
Digital Data Communications
*1 Bandwidth is determined
by plug-in modules and may exceed 70 GHz should higher speed modules become
available in the future.
The TDS8000B
Digital Sampling Oscilloscope offers the widest range of on-board measurement
and waveform-processing capabilities of any ultra-high bandwidth oscilloscope.
With excellent measurement repeatability, exceptional vertical resolution
and fast waveform acquisition and display update rates, the TDS8000B is a
powerful measurement tool for semiconductor testing, TDR characterization
of circuit boards, IC packages, cables and high-speed digital communications.
State-of-the-art
Waveform Acquisition
The TDS8000 Series' state-of-the-art timebase
provides equivalent time sweep speeds from 1.0 ps/div to 5 ms/div with record
lengths from 20 to 4000 points and a sample interval down to 10 femtoseconds
(0.01 ps). In addition, the 8000 Series Sampling Oscilloscopes' timebases
can be locked to a 10 MHz reference providing greater long-term stability.
This capability also allows multiple TDS8000Bs to be synchronized to other
test equipment and/or the device-under-test.
The TDS8000B offers two
magnification windows, whereby sections of the main trace are re-acquired
at higher resolution for closer examination of details.
The TDS8000B
boasts the highest sample rate among sampling oscilloscopes. Its multi-processor
architecture, with dedicated per channel digital signal processors (DSP),
guarantees the highest waveform acquisition rates regardless of the number
of channels acquired or waveform processing done.
Modularity and Flexibility
The
TDS8000B supports a large and growing family of electrical and optical plug-in
modules. This modular architecture lets you configure the instrument with
the right features for your application both now and in the future.
The
electrical plug-ins include a variety of modules with typical bandwidths up
to 70+ GHz and specialized features such as TDR for impedance and crosstalk
characterizations. High bandwidth probes are also available for constructing
a total acquisition solution.
The available optical modules provide
complete optical test solutions for both telecom (155 Mb/s to 43 Gb/s) and
datacom (Fibre Channel, InfiniBand and Gigabit Ethernet) applications as well
as general-purpose optical signal testing.
Unmatched TDR Capabilities
With
the 80E04 TDR Sampling Module, the TDS8000B offers unmatched TDR performance
on up to eight channels simultaneously. Each channel has an independent polarity
selectable step-generator offering unmatched 35 ps reflected rise time*2.
The TDS8000B provides the only true differential TDR system available today.
Automatic, transparent correction for variations in step amplitude and baseline
offset guarantee accuracy and repeatability of impedance measurements.
8000
Series Sampling Oscilloscope Platform
The TDS8000B is built on Tektronix'
sampling oscilloscope platform that combines familiar MS Windows-based PC
technologies with world-class waveform acquisition technology.
This
platform provides a wide array of standard instrumentation and communications
interfaces (such as GPIB, parallel printer port, RS-232-C and USB serial ports
and an Ethernet LAN connection). In addition, the platform includes several
mass storage devices (floppy disk, removable hard drive and CD-ROM).
The
TDS8000B is equipped with a large, full-color display that helps you discriminate
waveform details. Color-grading of waveform data adds a third dimension -
sample density - to your signal acquisitions and analysis.
Gated triggering,
a feature that allows the exclusion of selected time periods from being measured,
is offered as an option.
Because the system supports an open MS Windows
environment, new levels of data analysis can be done directly on the instrument
using commercially available software packages.
Additionally, TekVISA™,
a standard software feature, allows the instrument to be placed under the
control of software applications (e.g. LabView, LabWindows, Visual Basic,
Microsoft Excel, C, etc.) running on the instrument, or on external PC workstations
network connected to the instrument, without the need for a GPIB hardware
interface. Plug and play drivers for LabView and other programs are also supplied.
*2 The
observed rise time of a reflection from a short circuit.
8000 Series Sampling Oscilloscope
Optical Modules
80C01 Multi-rate Telecom Sampling Module - The 80C01 module
supports waveform conformance testing of long-wavelength (1100 to 1650 nm)
signals at 622, 2488 Mb/s and 9.953 Gb/s as well as general-purpose testing
with up to 20 GHz optical bandwidth. With its clock recovery option, the 80C01
provides testing solutions for 622 and 2488 Mb/s telecom applications.
80C02
High-performance Telecom Sampling Module - The 80C02 module
is optimized for testing of long-wavelength (1100 to 1650 nm) signals at 9.953 Gb/s
(SONET OC-192/SDH STM-64). With its high optical bandwidth of 30 GHz (typical),
it is also well-suited for general-purpose high-performance optical component
testing. The 80C02 can be optionally configured with clock recovery that supports
9.953 Gb/s telecom standards.
80C07B Multi-rate, Datacom &
Telecom Optical Sampling Module - The 80C07B module is
a broad wavelength (700 to 1650 nm) multi-rate optical sampling module optimized
for testing datacom/telecom signals from 155 to 2500 Mb/s. With its amplified
O/E converter design, this module provides excellent signal-to-noise performance,
allowing users to examine low-power optical signals. The 80C07B can be optionally
configured with clock recovery that supports 155, 622, 1063, 1250, 2125, 2488,
2500 and 2666 Mb/s rates.
80C08C Multi-rate, Datacom & Telecom
Optical Sampling Module with 10 GbE Forward Error Correction - The 80C08C module
is a broad wavelength (700 to 1650 nm) multi-rate optical sampling module
providing datacom rate testing for 10GbE applications at 9.953, 10.3125, 11.0957
Gb/s and 10G Fibre Channel applications at 10.51875 Gb/s. The 80C08C also
provides telecom rate testing at 9.953, 10.664, and 10.709 Gb/s. With its
amplified O/E converter design, this module provides excellent signal-to-noise
performance and high optical sensitivity, allowing users to examine low-power
level optical signals. The 80C08C can be optionally configured with clock
recovery options that can support any standard or user defined rate in the
continuous range from 9.8 to 12.6 Gb/s.
80C10 65 GHz 40 Gbps Optical
Sampling Module with 43 Gbps ITU-T G.709 Forward Error Correction - The 80C10 module
provides integrated and selectable reference receiver filtering, enabling
conformance testing at either 1310 nm or 1550 nm for 39.813 Gbps (OC-768/STM-256)
and 43.018 Gbps (43 Gbps ITU-T G.709 FEC) rates. In addition to the filter
rates, the user may also choose selectable bandwidths of 30 GHz or 65 GHz
for optimal noise vs. bandwidth performance for accurate signal characterization.
80C11
Multi-rate, Datacom & Telecom Optical Sampling Module - The 80C11 module
is a long wavelength (1100 to 1650 nm) multi-rate optical sampling module
optimized for testing 10 Gb/s datacom and telecom standard rates at 9.953,
10.3125, 10.51875, 10.664, 10.709, and 11.0957 Gb/s. With its high optical
bandwidth of up to 30 GHz (typical) it is well-suited for general purpose
high-performance 10 Gb/s optical component testing. The 80C11 can be optionally
configured with clock recovery options that can support any standard or user
defined rate in the continuous range from 9.8 to 12.6 Gb/s.
80C12
Multi-rate, Datacom & Telecom Optical Sampling Module - The 80C12 module
is a broad wavelength (700 to 1650 nm) multi-rate optical sampling module
providing multi-rate telecom and datacom testing. This highly flexible module
can be configured to support either lower data rate applications (1 to 4 Gb/s)
or a wide variety of 10Gb/s applications. The low data rate applications include:
1, 2, and 4 Gb/s FibreChannel and “by 4” wavelength division multiplex standards
such as 10GBase-X4 and 4-Lane 10 Gb/s FibreChannel. The supported 10Gb/s application
includes both datacom and telecom application. The supported 10Gb/s datacom
applications include 10GbE applications at 9.953, 10.3125, 11.0957 Gb/s and
10G Fibre Channel applications at 10.51875 Gb/s. The 80C12 also provides telecom
rate testing at 9.953, 10.664, and 10.709 Gb/s. With its amplified O/E converter
design, this module provides excellent signal-to-noise performance and high
optical sensitivity, allowing users to examine low-power level optical signals.
Clock recovery for the 80C12 is provided via the 80A05 (sold separately).
8000
Series Sampling Oscilloscope Electrical Modules
80E01 Sampling
Module - The 80E01 is a single-channel, 50 GHz bandwidth
sampling module. The 80E01 has a measured bandwidth of 50 GHz or more and
a calculated rise time of 7.0 ps or less. Displayed noise is typically 1.8 mVRMS.
The front-panel connector is female 2.4 mm and an adapter is provided (2.4 mm
male to 2.92 mm female) to maintain compatibility with SMA connector systems.
80E02
Low-noise Sampling Module - The 80E02 is a dual-channel,
12.5 GHz sampling module specifically designed for low-noise measurements
in digital communications and device characterization applications. It provides
an acquisition rise time of 28 ps and typically 400 μVRMS of displayed
noise. The 80E02 is the ideal instrument for low-noise applications. Common
applications for the 80E02 are capturing and displaying switching characteristics
of high-speed communications circuits, making accurate statistical measurements
of signal noise and signal timing jitter or obtaining stable timing measurements
of fast digital ICs.
80E03 Sampling Module - The 80E03 is
a dual-channel, 20 GHz sampling module. This sampling module provides an acquisition
rise time of 17.5 ps.
80E04 TDR Sampling Module - The 80E04 is
a dual-channel, 20 GHz sampling module with TDR capability. This sampling
module provides an acquisition rise time of 17.5 ps, with a typical 20 GHz
equivalent bandwidth. The TDR feature provides high resolution with true differential
capability and fast 35 ps reflected rise time of the TDR slope.
80E06
70+ GHz Sampling Module - The 80E06 is a single channel,
70+ GHz (typical bandwidth) sampling module with 5.0 ps calculated rise time.
Typical RMS noise is 1.8 mV. This sampling module provides a 1.85 mm (Type V)
front-panel connector and a precision adapter to 2.92 mm with a 50 Ω termination.
1 meter or 2 meter length Extender Cables can be ordered for remote operation
of the sampling module from the sampling oscilloscope mainframe.
80A05
Electrical Clock Recovery Module - The 80A05 enables
clock recovery for electrical signals, as well as internal triggering on the
recovered clock. The module recovers clocks from serial data streams for all
of the most common electrical standards in the 50 Mb/s to 4.26 Gb/s range.
Option 10G adds support for standard rates up to 12.6 Gb/s. The module accepts
either single-ended or differential signals at its input, providing both single-ended
and differential clock recovery. This module also serves as the clock recovery
module for the 80C12.
Characteristics
Signal
Acquisition
Acquisition Modes - Sample (normal), envelope
and average.
Number of Sampling Modules Accommodated - Up to
four, dual-channel electrical and two, single-channel optical sampling modules.
Number
of Simultaneously Acquired Inputs - Eight channels maximum (eight electrical
or two optical and six electrical).
Vertical Systems
Rise
Time/Bandwidth - Determined by the sampling modules used.
Vertical
Resolution - 14 bits over the sampling modules' dynamic range.
Horizontal
System
Main and Magnification View Timebases - 1 ps/div to
5 ms/div in 1-2-5 sequence or 1 ps increments.
Maximum Trigger
Rate - 200 kHz.
Typical Acquisition Rate - 150 Ksamples/sec.
per channel.
Time Interval Accuracy -
Horizontal scale
<21 ps/div: 1 ps + 1% of interval.
Horizontal scale ≥21 ps/div:
8 ps
+0.1% of interval (short-term optimized mode).
8 ps + 0.01% of interval
(locked to 10 MHz mode).
Horizontal Deskew Range: -500 ps to +100 ns
on any individual channel in 1 ps increments.
Record Length
- 20, 50, 100, 250, 500, 1000, 2000 or 4000 samples.
Magnification
Views - In addition to the main timebase, the TDS8000B supports two magnification
views. These magnifications are independently acquired using separate timebase
settings.
Trigger System
Trigger Sources - External
direct trigger.
External pre-scaled trigger.
Internal clock trigger:
internally connected to direct trigger.
Clock recovery triggers (from
optical sampling modules): internally connected to pre-scaled trigger.
Trigger
Sensitivity -
External direct trigger input:
50 mV, DC - 4 GHz
(typical).
100 mV, DC - 3 GHz (guaranteed).
Pre-scaled trigger
input:
800 mV, 2 to 3 GHz (guaranteed).
600 mV, 3 to 10 GHz
(guaranteed).
1000 mV, 10 to 12.5 GHz (typical).
Jitter
-
Short-term jitter optimized mode:
≤0.8 psRMS + 5 ppm
of position (typical).
≤1.2 psRMS + 10 ppm of position (max.).
Locked
to 10 MHz reference:
1.6 psRMS + 0.01 ppm of position (typical).
≤2.5 psRMS +
0.04 ppm of position (max.).
Internal Clock - Adjustable
from 25 to 200 kHz (drives TDR, internal clock output and calibrator).
Trigger
Level Range - ±1.0 V.
Trigger Input Range - ±1.5 V.
Trigger
Holdoff - Adjustable 5 μs to 100 ms in 2 ns increments.
External
Trigger Gate (optional) - TTL logic 1 enables acquisition, a TTL logic
0 disables acquisition, maximum non-destruct input level ± 5 V.
Display
Features
Touch Screen Display - 10.4 in. diagonal, color.
Colors
- 16,777,216 (24 bits).
Video Resolution - 640 horizontal
by 480 vertical displayed pixels.
Math/Measurement System Measurements
- The TDS8000B supports up to eight simultaneous measurements, updated
three times per second with optional display of per measurement statistics
(min, max, mean and standard deviation).
Measurement Set -
Automated
measurements include RZ, NRZ, and Pulse Signal types and the following:
Amplitude
Measurements High, Low, Amplitude, Max, Mid, Min, +Width, Eye Height,
Eye Opening Factor, Pulse Symmetry, Peak-to-Peak, Pk-Pk, +Overshoot, -Overshoot,
Mean, +Duty Cycle, Cycle Mean, RMS, Cycle RMS, AC RMS, Gain, Extinction Ratio
(Ratio, %, dB), Suppression Ratio (Ratio, %, dB), Peak to Peak Noise, RMS
Noise, Q-Factor, SNR, Average Optical Power, (dBm, watts), Phase, Optical
Modulation Amplitude.
Timing Measurements Rise, Fall, Period,
Bit Rate, Bit Time, Frequency, Crossing (%, Level, Time), +Cross, -Cross,
Jitter (peak-to-peak, RMS), Eye Width, +Width, -Width, Burst Width, +Duty
Cycle, -Duty Cycle, Duty Cycle Distortion, Delay, Phase.
Area Measurements Area,
Cycle Area.
Cursors - Dot, vertical bar and horizontal
bar cursors.
Waveform Processing - Up to eight math waveforms
can be defined and displayed using the following math functions: Add, Subtract,
Multiply, Divide, Average, Differentiate, Exponentiate, Integrate, Natural
Log, Log, Magnitude, Min, Max, Square Root and Filter.
In addition, measurement
values can be utilized as scalars in math waveform definitions.
TDR
System (TDS8000B with 80E04 Electrical Module)
TDR Channels - 2
per 80E04.
TDR Amplitude - 250 mV (polarity of either step
may be inverted).
TDR System Rise Time - <35 ps.
Time
Coincidence Between TDR Steps - <1 ps.
Source Resistance
- 50 ±0.5 Ω.
Typical Aberrations (at +250 mV amplitude) - ±3%
or less over zone 10 ns to 20 ps before step transition.
+10%, -5% or less,
for first 400 ps following step transition.
±3% or less over zone 400 ps
to 5 ns following step transition.
±1% or less over zone 5 ns to 100 ns
following step transition.
±0.5% after 100 ns following step transition.
Power
Requirements
Line Voltage and Frequency - - 100 to 240 VAC
±10% 50/60 Hz.
115 VAC ±10% 400 Hz.
Environmental
Temperature
- Operating: +10 °C to +40 °C.
Nonoperating: -22 °C to +60 °C.
Relative
Humidity - Operating: Floppy disk and CD ROM not installed: 20% to 80%
at or below 40 °C (upper limit de-rates to 45% relative humidity at 40 °C).
Nonoperating:
5% to 90% at or below 60 °C (upper limit de-rates to 20% relative humidity
at +60 °C).
Altitude - Operating: 3048 m (10,000 ft.);
nonoperating: 12190 m (40,000 ft.).
Safety - UL 3111-1, CSA-22.2
No. 1010.1, EN 61010-1.
Physical Characteristics for Optical Sampling
Modules
|
|
Dimensions (mm/inches)
|
Weight (kg/lb)
|
|
|
Width
|
Height
|
Depth
|
Net
|
|
80C01
|
165/6.5
|
25/1.0
|
305/12.0
|
<2.61/<5.75
|
|
80C02
|
165/6.5
|
25/1.0
|
305/12.0
|
<2.61/<5.75
|
|
80C07B
|
165/6.5
|
25/1.0
|
305/12.0
|
<1.36/<3.0
|
|
80C08C
|
165/6.5
|
25/1.0
|
305/12.0
|
<1.22/<2.7
|
|
80C10
|
165/6.5
|
25/1.0
|
305/12.0
|
>2.61/>5.75
|
|
80C11
|
165/6.5
|
25/1.0
|
305/12.0
|
<1.22/<2.7
|
|
80C12
|
165/6.5
|
25/1.0
|
305/12.0
|
<2.61/<5.75
|
Optical Sampling Module Characteristics (Refer to Optical
Sampling Module User Manual for more detailed information)
|
|
Application Type
|
Standards and supported data filtering rates
|
Number of Input Channels
|
Effective Wavelength Range
|
Calibrated Wavelengths
|
|
80C01
|
Tributary Telecom
|
OC-12/STM-4 (622 Mb/s), OC-48/STM-16 (2.488 Gb/s), OC-192/STM-64 (9.953
Gb/s)
|
1
|
1100 nm to 1650 nm
|
1310 nm and 1550 nm (±20 nm)
|
|
80C02
|
10 Gb/s Telecom
|
OC-192/STM-64 (9.953 Gb/s)
10GBASE-W (9.953 Gb/s)
|
1
|
1100 nm to 1650 nm
|
1310 nm and 1550 nm (±20 nm)
|
|
80C07B
|
Tributary Datacom/Telecom
|
Standard Included: OC-48/STM-16 (2.488 Gb/s), Infiniband, 2 GbE (2.500
Gb/s);Optional (choose any two): OC-3/STM-1 (155 Mb/s), OC-12/STM-4 (622 Mb/s),
FibreChannel (1.063 Gb/s), GbE (1.250 Gb/s), 2G FibreChannel (2.125 Gb/s)
|
1
|
700 nm to 1650 nm
|
780 nm, 850 nm, 1310 nm, and 1550 nm (±20 nm)
|
|
80C08C
|
10 Gb/s Datacom/Telecom
|
OC-192/STM-64 (9.953 Gb/s), 10GBASE-W (9.953 Gb/s), 10GBASE-R (10.31
Gb/s), 10G Fibre Channel (10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s), ITU-T
G.709 (10.709 Gb/s),10 GbE FEC (11.1 Gb/s)
|
1
|
700 nm to 1650 nm
|
780 nm, 850 nm, 1310 nm, and 1550 nm (±20 nm)
|
|
80C10
|
40 Gb/s Telecom
|
OC-768/STM-256 (39.813 Gb/s),ITU-T G.709 FEC (43.018 Gb/s)
|
1
|
1310 nm and 1550 nm
|
1310 nm and 1550 nm (±20 nm)
|
|
80C11
|
10 Gb/s Datacom/Telecom
|
OC-192/STM-64 (9.953 Gb/s), 10GBASE-W (9.953 Gb/s), 10GBASE-R (10.31
Gb/s), 10G Fibre Channel (10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s), ITU-T
G.709 (10.709 Gb/s), 10 GbE FEC (11.1 Gb/s)
|
1
|
1100 nm and 1650 nm
|
1310 nm and 1550 nm (±20 nm)
|
|
80C12
|
FibreChannel, Datacom rates between 2.5Gb/s and 10Gb/s.
Option
10G: 10Gb/s multistandard low cost
|
Option 10G: OC192/STM64 (9.953 Gb/s), 10GBaseW (9.953 Gb/s),10GBaseR
(10.31 Gb/s),10 GFC (10.51 Gb/s), G.975 FEC (10.66 Gb/s), G.709 FEC (10.71
Gb/s), 10 GBE FEC (11.10 Gb/s).
Option F1: 1.063 Gb/s, 2.125 Gb/s,
and 4.25 Gb/s FC.
Option F2: 2.125 Gb/s, 4.25 Gb/s FC, 9 GHz.
Option
F3: 1.063 Gb/s, 2.125 Gb/s FC, 9 GHz.
Option F4: 2.125 Gb/s, 10GBase-LX4,
3.188Gb/s, 4.25 Gb/s FC.
Option F5: 10GBase-LX4, 3.188Gb/s, 4.25 Gb/s
FC, 9 GHz.
Option F6: 2.125 Gb/s FC, 10GBase-LX4, 3.188Gb/s, 9 GHz.
Option
FC: 11GBase-LX4 filter, 3.188Gb/s, 3.318 GHz, 9 GH
|
1
|
700 nm to 1650 nm
|
850, 1310 and 1550 nm (±20 nm)
|
Optical Sampling Module Characteristics (continued)
|
|
Clock Recovery (Optional)
|
Clock Recovery Outputs
|
Unfiltered Optical Bandwidth*1
|
Absolute Maximum Nondestructive Optical Input
|
Internal Fiber Diameter
|
|
80C01
|
Option CR: 622 Mb/s, 2.488 Gb/s
|
±Clock, ±Data
|
20 GHz
|
5 mW average; 10 mW peak power at wavelength of highest relative responsivity
|
9 μm/125 μm single-mode
|
|
80C02
|
Option CR: 9.953 Gb/s
|
Clock, Clock/16, Data
|
28 GHz
|
5 mW average; 10 mW peak power at wavelength of highest relative responsivity
|
9 μm/125 μm single-mode
|
|
80C07B
|
Option CR1: 155 Mb/s, 622 Mb/s, 1.063 Gb/s, 1.250 Gb/s, 2.125 Gb/s,
2.488 Gb/s, 2.500 Gb/s, 2.666 Gb/s
|
±Clock, ±Data
|
2.5 GHz
|
5 mW average; 10 mW peak power at wavelength of highest responsivity
|
62.5 μm/125 μm multi-mode
|
|
80C08C
|
Option CR1: 9.953 Gb/s, 10.31 Gb/s;
Option CR2: 10.31 Gb/s,
10.52 Gb/s;
Option CR4: Continuous from 9.8 Gb/s to 12.6 Gb/s
|
Clock, Clock/16
|
10 GHz
|
1 mW average; 10 mW peak power at wavelength of highest responsivity
|
single-mode and multi-mode fibers up to core diameter of 62.5 μm
|
|
80C10
|
Future Upgradeable
|
Future
|
65 GHz
|
20 mW average; 60 mW peak power at wavelength of highest relative
responsivity
|
9 μm/125 μm single-mode
|
|
80C11
|
Option CR1: 9.953 Gb/s;
Option CR2: 9.953 Gb/s, 10.664 Gb/s;
Option
CR3: 9.953 Gb/s, 10.709 Gb/s;
Option CR4: Continuous between 9.8 Gb/s
to 12.6 Gb/s
|
CR1: Clock, Clock/16, Data;
CR2, CR3, CR4: Clock, Clock/16
|
28 GHz
|
5 mW average; 10 mW peak power at wavelength of highest responsivity
|
9 μm/125 μm single-mode
|
|
80C12
|
Provided by separately sold 80A05 (50 Mb/s to 12.6 Gb/s)
|
(Clk/16, 10G Clk)
|
4 to 10 Gb/s depending on option
|
1mW average; 10 mW peak power at wavelength of highest responsitivity
|
single-mode and multi-mode fibers up to core diameter of 62.5 μm
|
*1 Values shown are warranted unless printed in
an italic typeface which represents a typical value.
Optical Sampling
Module Characteristics (continued)
|
|
Optical Return Loss
|
Fiber Input Accepted
|
RMS Optical Noise (typical)
|
RMS Optical Noise (maximum)
|
Independent Channel Deskew
|
|
80C01
|
>30 dB
|
single-mode
|
8.0 μW at 622 Mb/s, 2.488 Gb/s, 9.953 Gb/s, 12.5 GHz;
15.0 μW
at 20 GHz
|
12.0 μW at 622 Mb/s, 2.488 Gb/s, 9.953 Gb/s, 12.5 GHz;
25 μW
at 20 GHz
|
Standard
|
|
80C02
|
>30 dB
|
single-mode
|
6.0 μW at 9.953 Gb/s, 12.5 GHz;
10.0 μW at 20 GHz;
15.0 μW
at 30 GHz
|
10.0 μW at 9.953 Gb/s, 12.5 GHz mode;
15 μW at 20 GHz;
30 μW
at 30 GHz
|
Standard
|
|
80C07B
|
>14 dB (multi-mode) >24 dB (single-mode)
|
single- or multi-mode
|
0.50 μW at 155 Mb/s, 622 Mb/s, 1063 Mb/s, 1250 Mb/s;
0.70 μW
at 2.488/2.500 Gb/s
|
1.0 μW at 155 Mb/s, 622 Mb/s, 1063 Mb/s, 1250 Mb/s;
1.5 μW
at 2.488/2.500 Gb/s
|
Standard
|
|
80C08C
|
>14 dB (multi-mode) >24 dB (single-mode)
|
single- or multi-mode
|
1.7 μW at all filter rates
|
3.0 μW at all filter rates
|
Standard
|
|
80C10
|
>30 dB
|
single-mode
|
40 μW at 39.813 Gb/s, 43.018 Gb/s (1550 nm); 75 μW at 39.813 Gb/s,
43.018 Gb/s (1310 nm);
30 μW at 30 GHz mode (1550 nm); 55 μW at 30 GHz
mode (1310 nm);
85 μW at 65 GHz mode (1550 nm); 150 μW at 65 GHz mode
(1310 nm)
|
60 μW at 39.813 Gb/s, 43.018 Gb/s (1550 nm); 110 μW at 39.813 Gb/s,
43.018 Gb/s (1310 nm);
50 μW at 30 GHz (1550 nm); 90 μW at 30 GHz (1310 nm);
120 μW
at 65 GHz (1550 nm); 220 μW at 65 GHz (1310 nm)
|
Standard
|
|
80C11
|
>30 dB
|
single-mode
|
5.5 μW at all filter rates;
10.0 μW at 20 GHz
20.0 μW
at 30 GHz
|
8.0 μW at all filter rates;
14.0 μW at 20 GHz
30.0 μW
at 30 GHz
|
Standard
|
|
80C12
|
>14 dB (62.5 μm multi-mode)
>24 dB (9 μm single mode)
|
single- or multi-mode
|
Below 9Gb/s: 1.7 μW
Above 9Gb/s and 9GHz: 3.4 μW
|
Below 9Gb/s: 3 µW
Above 9Gb/s and 9GHz: 6 µW
|
Standard
|
Optical Sampling Module Characteristics (continued)
|
|
Offset Capability
|
Power Meter
|
Power Meter Range
|
Power Meter Accuracy
|
Mask Test Optical Sensitivity*2
|
|
80C01
|
Standard
|
Standard
|
+4 dBm to -30 dBm
|
5% of reading
|
-8 dBm at 622 Mb/s, 2.488 Gb/s, 9.953 Gb/s; -5.0 dBm at 20 GHz
|
|
80C02
|
Standard
|
Standard
|
+4 dBm to -30 dBm
|
5% of reading
|
-9 dBm at 9.953 Gb/s; -7 dBm at 20 GHz; -4 dBm at 30 GHz
|
|
80C07B
|
Standard
|
Standard
|
+4 dBm to -30 dBm
|
5% of reading
|
-22 dBm at 155 Mb/s, 622 Mb/s; -20 dBm at 2488/2500 Mb/s
|
|
80C08C
|
Standard
|
Standard
|
0 dBm to -30 dBm
|
5% of reading
|
-15 dBm at all filter rates
|
|
80C10
|
Standard
|
Standard
|
+13 dBm to -21 dBm
|
5% of reading
|
0 dBm at 39.813 Gb/s, 43.018 Gb/s; 0 dBm at 30 GHz; +3 dBm at 65 GHz
|
|
80C11
|
Standard
|
Standard
|
+4 dBm to -30 dBm
|
5% of reading
|
-10 dBm at all filter rates; -7 dBm at 20 GHz; -4 dBm@ 30 GHz
|
|
80C12
|
Standard
|
Standard
|
0 dBm to -30 dBm
|
5% of reading
|
Below 9Gb/s: -15 dBm
Above 9Gb/s and 9GHz: -12 dBm
|
*2 Smallest power level for mask test. Values
represent theoretical typical sensitivity of NRZ eyes for competitive comparison
purposes. Assumes instrument peak-peak noise consumes most of the mask margin.
Physical
Characteristics for Electrical Sampling Modules
|
|
Dimensions (mm/inches)
|
Weight (kg/lb)
|
|
|
Width
|
Height
|
Depth
|
Net
|
|
80E01
|
79/3.1
|
25/1.0
|
135/5.3
|
0.4/0.87
|
|
80E02
|
79/3.1
|
25/1.0
|
135/5.3
|
0.4/0.87
|
|
80E03
|
79/3.1
|
25/1.0
|
135/5.3
|
0.4/0.87
|
|
80E04
|
79/3.1
|
25/1.0
|
135/5.3
|
0.4/0.87
|
|
80E06
|
79/3.1
|
25/1.0
|
135/5.3
|
0.4/0.87
|
Electrical Sampling Module Characteristics (Refer to
Electrical Sampling Module User Manual for more detailed information)
|
|
Application Type
|
Channels
|
Input Impedance
|
Channel Input Connector
|
Bandwidth*3
|
|
80E01
|
Microwave General Purpose
|
1
|
50 ±0.5 Ω
|
2.4 mm female precision adapter to 2.92 mm included with 50 Ω SMA
termination
|
50 GHz
|
|
80E02
|
Low-level Signals
|
2
|
50 ±0.5 Ω
|
3.5 mm female
|
12.5 GHz*4
|
|
80E03
|
Device Characterization
|
2
|
50 ±0.5 Ω
|
3.5 mm female
|
20 GHz*4
|
|
80E04
|
TDR Impedance Characterization with single-ended, common, differential
TDR capability
|
2
|
50 ±0.5 Ω
|
3.5 mm female
|
20 GHz*4
|
|
80E06
|
High-speed Electrical Device Characterization
|
1
|
50 ±0.5 Ω
|
1.85 mm female precision adapter to 2.92 mm included with 50 Ω SMA
termination
|
70+ GHz
|
*3 Values shown are warranted unless printed in
an italic typeface which represents a non-warranted characteristic value that
the instrument will typically perform to.
*4 Risetime is
calculated from the formula Risetime = 0.35/Bandwidth; Bandwidth is calculated
from the formula Bandwidth = 0.35/Risetime
Electrical Sampling
Module Characteristics (continued)
|
|
Rise Time (10% to 90%)
|
Dynamic Range
|
Offset Range
|
Maximum Input Voltage
|
Vertical Number of Digitized Bits
|
|
80E01
|
7 ps*4
|
1.0 Vp-p
|
±1.6 V
|
±2.0 V
|
14 bits full scale
|
|
80E02
|
≤28 ps
|
1.0 Vp-p
|
±1.6 V
|
±3.0 V
|
14 bits full scale
|
|
80E03
|
≤17.5 ps
|
1.0 Vp-p
|
±1.6 V
|
±3.0 V
|
14 bits full scale
|
|
80E04
|
≤17.5 ps
|
1.0 Vp-p
|
±1.6 V
|
±3.0 V
|
14 bits full scale
|
|
80E06
|
5.0 ps*4
|
1.0 Vp-p
|
±1.6 V
|
±2.0 V
|
14 bits full scale
|
*4 Risetime is calculated from the formula Risetime
= 0.35/Bandwidth; Bandwidth is calculated from the formula Bandwidth = 0.35/Risetime
Electrical
Sampling Module Characteristics (continued)
|
|
Vertical Sensitivity Range
|
DC Vertical Voltage Accuracy, Single Point, Within ±2 °C of Compensated
Temperature
|
Typical Step Response Aberrations*5
|
RMS Noise*5
|
|
80E01
|
10 mV to 1.0 V full scale
|
± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]
|
±3% or less over the zone 10 ns to 20 ps before step transition;
+12%, -5% or less for the first 300 ps following step transition; +5.5%, -3%
or less over the zone 300 ps to 3 ns following step transition; ±1% or less
over the zone 3 ns to 100 ns following step transition; ±0.5% after 100 ns
following step transition
|
1.8 mV
≤2.3 mV (maximum)
|
|
80E02
|
10 mV to 1.0 V full scale
|
± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]
|
±3% or less over the zone 10 ns to 20 ps before step transition;
+10%, -5% or less for the first 300 ps following step transition; ±3% or less
over the zone 300 ps to 5 ns following step transition; ±1% or less over the
zone 5 ns to 100 ns following step transition; ±0.5% after 100 ns following
step transition
|
400 μV
≤800 μV (maximum)
|
|
80E03
|
10 mV to 1.0 V full scale
|
± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]
|
±3% or less over the zone 10 ns to 20 ps before step transition;
+10%, -5% or less for the first 300 ps following step transition; ±3% or less
over the zone 300 ps to 5 ns following step transition; ±1% or less over the
zone 5 ns to 100 ns following step transition; ±0.5% after 100 ns following
step transition
|
600 μV
≤1.2 mV (maximum)
|
|
80E04
|
10 mV to 1.0 V full scale
|
± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]
|
±3% or less over the zone 10 ns to 20 ps before step transition;
+10%, -5% or less for the first 300 ps following step transition; ±3% or less
over the zone 300 ps to 5 ns following step transition; ±1% or less over the
zone 5 ns to 100 ns following step transition; 0.5% after 100 ns following
step transition
|
600 μV
≤1.2 mV (maximum)
|
|
80E06
|
10 mV to 1.0 V full scale
|
± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]
|
±5% or less for first 300 ps following step transition
|
1.8 mV
≤2.4 mV (maximum)
|
*5 Values shown are warranted unless printed in
an italic typeface which represents a non-warranted characteristic value that
the instrument will typically perform to.
TDR System (80E04 only)
|
|
80E04*6
|
|
Channels
|
2
|
|
Input Impedance
|
50 ±0.5 Ω
|
|
Channel Input Connector
|
3.5 mm
|
|
Bandwidth
|
20 GHz
|
|
TDR Step Amplitude
|
250 mV (polarity of either step may be inverted)
|
|
TDR System Reflected Rise Time
|
≤35 ps each polarity
|
|
TDR System Incident Rise Time
|
28 ps (typical)
|
|
TDR Step Maximum Repetition Rate
|
200 kHz
|
|
TDR System Step Response Aberrations
|
±3% or less over the zone 10 ns to 20 ps before step transition;
+10%, -5% or less typical for the first 400 ps following step transition;
±3% or less over the zone 400 ps to 5 ns following step transition; ±1% or
less after 5 ns following step transition
|
*6 Values shown are warranted unless printed in
an italic typeface which represents a non-warranted characteristic value that
the instrument will typically perform to.
Ordering
Information
TDS8000B
Digital Sampling Oscilloscope.
Includes: User
manual, quick reference card, Microsoft Windows 2000 compatible keyboard,
Windows 2000 compatible mouse, touch screen stylus, online help, programmer
online guide, power cord.
With OpenChoice™ software, Tektronix provides
enhanced test and measurement analysis with the capability of full integration
of third-party software on the Open Windows oscilloscopes. By working with
the industry leaders, National Instruments and The MathWorks, examples of
software programs from these companies are featured on all Tektronix Open Windows
oscilloscopes.
TDS8000B Options
Opt. C3 - Three years
of Calibration Service.
Opt. D1 - Calibration data report.
Opt.
D3 - Three years of Calibration data reports.
Opt. GT - Gated
Trigger.
Opt. R3 - Extended repair warranty to three years.
Opt.
1K - Cart.
Opt. 1R - Rackmount kit (includes: hardware,
tooling and instructions for converting bench model to rackmount configuration).
International
Power Cord Options
Option A0 - North America power.
Option
A1 - Universal EURO power.
Option A2 - United Kingdom power.
Option
A3 - Australia power.
Option A4 - 240 V, North America
power.
Option A5 - Switzerland power.
Option A99
- No power cord or AC adapter.
Option AC - China power.
Other
Accessories
Calibration Step Generator with Power Cords -
Std,
US: 067-1338-00.
A1, Europe: 067-1338-01.
A2, UK: 067-1338-02.
A3,
Australia: 067-1338-03.
A4, North America: 067-1338-04.
A5,
Switzerland: 067-1338-05.
A6, Japan: 067-1338-06.
SIU800
Static Isolation Unit - Order SIU800.
Sampling Module Extender
Cable (1 meter) - Order 012-1568-00.
Sampling Module Extender
Cable (2 meter) - Order 012-1569-00.
2X Attenuator (SMA Male-to-female)
- Order 015-1001-01.
5X Attenuator (Male-to-female) - Order
015-1002-01.
Adapter (2.4 mm male to 2.92 mm female) - Order
011-0157-01.
Power Divider - Order 015-1014-00.
Rackmount
Kit - Order 016-1791-01.
80A01 - Pre-scaled Trigger Amplifier:
The 80A01 Pre-scaled Trigger Amplifier provides enhanced triggering capability
on low-level signals up to 12.5 GHz. This module plugs into any of the four
available electrical sampling module slots on the TDS8000B and the CSA8000B mainframes.
It is ideally suited for component designers and manufacturers who are verifying
the performance of optical and electrical components that run at non-standard
clock rates up to 12.5 GHz.
80A03 - TekConnect™ Probe Interface
Module. The 80A03 TekConnect Probe Interface Module provides an interface
to Tektronix P7000 series high-performance active and differential probes
with 3 GHz bandwidths and higher. The 80A03 accepts up to two P7000 series
probes and one electrical sampling module. It plugs into any of the four available
electrical sampling module slots on the TDS8000B and CSA8000B mainframes.
The 80A03 and P7000 series probes are ideally suited for probing directly
on IC pins, traces, or test points that are not accessible through a connector.
P7225
- 2.5 GHz Active Probe.
P6209 - 4 GHz Active FET Probe.
P6150
- 9 GHz Passive Probe.
K4000 Mobile Workstation.
