Features & Benefits
- Auto-configuration Wizard Guides
Easy Setup and Test Configuration
- Analyze All Read/Write
Bursts in the Entire Acquisition
- Plot DQS and DQ Eye Diagrams
for Reads and Writes
- Perform JEDEC Conformance Tests with
Pass/Fail Limits
- Use Chip Select to Qualify Multi-rank Measurements
- Navigate and Time Stamp Reads and Writes in an Acquired Record
using Search and Mark
- Use Pinpoint Triggering and DPX to
Quickly Identify Infrequent Anomalies
- Easily Move between
Conformance-test and Analysis/Debug Tools
- Automatically Produce
Consolidated Reports with Pass/Fail Information, Statistical Measurement
Results, and Test-setup Information
Applications
- DDR1
- DDR2
- DDR3
- GDDR3
- LPDDR
- LPDDR2
Option
DDRA accelerates the analysis, validation, and JEDEC conformance testing
of memory systems based on DDR1, DDR2, DDR3, and DDR derivative technologies
like LPDDR, LPDDR2, and GDDR3. Option DDRA supports the common data
rates plus custom data rates up to and beyond 1600 MT/s. Whether you
are doing intensive signal integrity analysis or debugging a specific
memory transaction, DDRA will speed your ability to trigger on and
identify read and write bursts in the acquired data record and then
perform parametric measurements on the signals of interest.
DDRA Wizard for Easy Test Selection and Configuration
The
wizard consolidates Tektronix experience and expertise in DDR testing
into a simple, easy-to-follow test selection interface. The user selects
which DDR technology, speed grade, and measurement group (reads, writes,
clocks, address, and control lines) they are testing, using check
boxes to select some or all measurements in a category. DDRA can then
automate oscilloscope scale selection, DQ and DQS level selections,
and threshold detection, then automate burst identification using
search and mark. Search and mark (for read/write measurements) data
is used to identify and separate all read vs. write bursts across
the entire acquisition and qualify measurement zones for use by DPOJET
Advanced Jitter and Eye Analysis. DPOJET will generate an eye diagram
of the data and perform JEDEC standard measurements qualified on read
or write bursts. Measurement configurations and JEDEC pass-fail limits
are automatically applied for the selected measurements. Every edge
in each identified burst is measured, then measurement results are
included in statistics and plots for a complete analysis of the acquired
waveform.
DDR Analysis Menu
JEDEC-conforming Measurements and Conformance Testing
|
DDR Specification Conformance
|
|
DDR
|
JESD79E (May 2005)
|
|
DDR2
|
JESD79-2E (April 2008)
|
|
DDR3
|
JESD79-3C (November 2008)
|
|
LPDDR
|
JESD79-4A (April 2007)
|
|
LPDDR2
|
JESD209-2 (March 2009)
|
Comprehensive Measurements for JEDEC Conformance
Testing
Option DDRA adds a long list of JEDEC-specific measurements
to the rich toolset of generic jitter, timing, and signal-quality
measurements already present in DPOJET. In addition to the measurements
shown below (for DDR2 in this example), Option DDRA also performs
de-rating of Setup and Hold pass/fail limits based on the result of
slew rate measurements, as stipulated by JEDEC in the test specs for
DDR2 and DDR3 (JESD79-3C, JESD79-2E as of this writing).
JEDEC Measurements Supported for DDR2
|
tCK (avg)
|
tDS - diff (base)
|
tIPW
|
|
tCK (abs)
|
tDS - SE (base)
|
tIS (base)
|
|
tCH (avg)
|
tDS - diff - DERATED
|
tIH (base)
|
|
tCH (abs)
|
tDS - SE - DERATED
|
tIS - DERATED
|
|
tCL (avg)
|
tDH - diff (base)
|
tIH - DERATED
|
|
tCL (abs)
|
tDH - SE (base)
|
Vid - diff (AC)
|
|
tHP
|
tDH - diff - DERATED
|
Vix (AC) - DQS
|
|
tJIT (duty)
|
tDH - SE - DERATED
|
Vix (AC) - CLK
|
|
tJIT (per)
|
tDIPW
|
Vox (AC) - DQS
|
|
tJIT (cc)
|
tAC - diff
|
Vox (AC) - CLK
|
|
tERR (02)
|
tDQSCK - diff
|
InputSlew - Rise (DQS)
|
|
tERR (03)
|
tDQSCK - SE
|
InputSlew - Fall (DQS)
|
|
tERR (04)
|
tDQSQ - diff
|
InputSlew - Rise (CLK)
|
|
tERR (05)
|
tDQSQ - SE
|
InputSlew - Fall (CLK)
|
|
tERR (6 - 10 per)
|
tQH
|
AC - Overshoot Amplitude - diff
|
|
tERR (11 - 50 per)
|
tDQSS
|
AC - Undershoot Amplitude - diff
|
|
tDQSH
|
tDSS
|
AC - Overshoot Amplitude - SE
|
|
tDQSL
|
tDSH
|
AC - Undershoot Amplitude - SE
|
|
|
|
Data Eye Width
|
Easily Switch between Conformance Testing and Advanced
Debug Tools
DDRA gives you the option to easily switch between
conformance testing and advanced analysis and debug modes. The power
of the DPOJET analysis engine allows you flexibility to reconfigure
existing measurements or add new measurements not specifically required
by JEDEC and to create new user-specified test limits. You can also
use features like logging, filters, histograms, and time trends in
addition to the information produced by the DDRA wizard.
Fast
Fault Identification using Pinpoint® Triggers and DPX Technology
In addition to all of the measurement and analysis tools that
DDRA offers, you can use Pinpoint® triggering and DPX® to find infrequent signal events. Pinpoint® triggering
allows you to trigger on reads or writes so that all write bursts
can be shown. Once you have set the hardware triggering on a read
or write condition, you can use DPX®, the industry’s highest
waveform acquisition rate for signal integrity testing and to determine
specific DDR read/write signal characteristics. DPX® enables
quick identification of infrequent events by using a color-graded
display to see both frequent and infrequent waveform events, such
as areas where there is bus contention, reflections, or system timing
issues.
Additional Capabilities using a Performance MSO (Mixed-Signal
Oscilloscope)
The MSO70000 Series Performance MSOs allow you
to probe more signals on the DDR bus and to trigger on and view specific
bus events. Up to 16 digital channels can be used to view logic states
of command and address signals such as RAS, CAS, WE, CE, CS, etc.
Signal integrity of these 16 inputs can be analyzed using the iCapture™
multiplexing feature, which allows any of the digital input signals
to be internally routed to one of the scope’s four analog channels.
Events such as initialization, power state changes, and command-bus
cycle timing can also be analyzed using the bus-decoding features
of the MSO.
Full Bus Analysis using Logic Analyzer and Oscilloscope
When full protocol analysis or probing of the entire memory bus
is required, a logic analyzer can provide this additional capability.
The TLA7000 Series logic analyzers can also be linked with Tektronix
oscilloscopes to provide an integrated test setup using tools such
as iCapture mentioned above. This eliminates the need for double probing
and allows full analog capture of any signals probed by the logic
analyzer. In addition, the iView™ display interface allows transfer
of the oscilloscope data to the logic analyzer display, so that data
from both instruments are analyzed and time-aligned on one display
screen.
Ordering Information
DDRA
DDR Memory
Bus Electrical Validation and Analysis Oscilloscope Software.
To Order on a New DPO7000, DPO70000B, DSA70000B*3,
or MSO70000:
|
Order
|
Description
|
|
Opt. DDRA
|
Preinstall on a new DPO7000, DPO70000, DSA70000, or MSO70000
Series oscilloscope*4
|
*3 Note: Opt. DJA is standard on the DSA70000B
Series oscilloscopes.
*4 Note: Opt. ASM (Advanced
Event Search and Mark) and Opt. DJA (DPOJET) are required.
To upgrade an existing DPO7000, DPO70000, DSA70000, or MSO70000
order the appropriate model number and option listed below. For example,
DPO7UP DDRA.
|
DPO7000
|
DPO70000B
|
DSA70000B
|
MSO70000
|
|
DPO7UP
|
DPO7UP
|
DPO7UP
|
DPO-UP
|
|
Upgrade options for DPO7000, DPO70000B, DSA70000B,
MSO70000
|
|
DDRA
|
Upgrade to option DDRA (requires options ASM and
DJA)
|
|
ASM
|
Upgrade DPO70000B and MSO70000 with Advanced Event
Search and Mark (Opt. ASM)
|
|
DJAM
|
Upgrade DPO7000 with DPOJET Jitter and Eye Diagram
Analysis (Opt. DJA)
|
|
DJAH
|
Upgrade DPO70404B – DPO70804B or MSO70404 – MSO70804
with DPOJET Jitter and Eye Diagram Analysis (Opt. DJA)
|
|
DJAU
|
Upgrade DPO71254B – DPO72004B or MSO71254 – MSO72004
with DPOJET Jitter and Eye Diagram Analysis (Opt. DJA)
|
|
DJUP
|
Upgrade DSA70000B with DPOJET Jitter and Eye Diagram
Analysis (Opt. DJA)
|
Note: Software is supplied on the internal
hard drive of the DPO7000, DPO/DSA70000 Series oscilloscopes. User
documentation (online or user manual) is part of the oscilloscope
documentation.
Recommended Accessories
|
Order
|
Description
|
|
P7500 Series
|
TriMode™ Differential Probe
|
|
020-2955-xx
|
Micro-coax Tips (TriMode) for P7500 probes
|
|
020-3022-xx
|
Micro-coax Tips (TriMode) for P7500 probes*5
|
|
020-2954-xx
|
Socket Cable for P7500 probes
|
|
P6780
|
Differential Logic Probe for MSO70000
|
|
Recommended Nexus Technology Accessories
|
|
NEX-DDR3MP78BSC
|
BGA Interposer for DDR3 x4/x8-solder version
|
|
NEX-DDR3MP78BSCSK
|
BGA Interposer for DDR3 x4/x8-socket version
|
|
NEX-DDR3MP96BSC
|
BGA Interposer for DDR3 x16-solder version
|
|
NEX-DDR3MP96BSCSK
|
BGA Interposer for DDR3 x16-socket version
|
|
NEX-DDR2MP60BSC
|
BGA Interposer for DDR2 x4/x8-solder version
|
|
NEX-DDR2MP60BSCSK
|
BGA Interposer for DDR2 x4/x8-socket version
|
|
NEX-DDR2MP84BSC
|
BGA Interposer for DDR2 x16-solder version
|
|
NEX-DDR2MP84BSCSK
|
BGA Interposer for DDR2 x16-socket version
|
|
Note: For more detailed information contact http://www.nexustechnology.com
|
*5 For use with BGA Interposers only.
BGA Interposer probing solution for DDR2/DDR3
TLA7000 Series logic analyzer and Logic
Probes Connection to the oscilloscope through Analog Mux. See www.tektronix.com/logic_analyzers
P7500 Series TriMode™ probe.
020-2955-xx Micro-Coax tips soldered to DIMM.