Features & Benefits
- Provides a Comprehensive Toolset
for USB 3.0 Verification, Characterization, Debug, and Compliance
Test
- Automated USB 3.0 Normative and Informative Transmitter
Tests – Single-button Execution with No User Interaction Required
- Full Control of Analysis Parameters enables Seamless Integration
between Compliance and Debug Environments
- Predefined CTLE
Filter provided as per the USB 3.0 Specification, Additional CTLE
Filters can be Customized with Serial Data Link Analysis Software
(Opt. SLA)
- Software Channel Emulation Models are defined
for Host Channel Back Panel, Host Channel Front Panel, Cable, and
Device Channel
- Flexible Fixture Options enable Test Access
at both the Transmitter and Receiver Test Points and provide access
to both USB 3.0 Transmitter and Receiver Signals
- Quickly
Validate Test Status with Comprehensive Reports Detailing Test Margins
and Pass/Fail Results
Applications
- USB 3.0 Transmitter Testing
for:
- USB 3.0 Host and Device Silicon Validation
- System Validation and Integration
- Manufacturing Test
Show Schematic
View Report
Complete Automation for USB 3.0 Testing
Tektronix’ TekExpress (TEKEXP) Automated Test Software is a Windows-based
application that runs on any Windows XP*1 computer operating
system including Tektronix Windows-based instruments. TekExpress software
ordered with Option USB-TX provides an automated, simple, and efficient
way to test USB 3.0 transmitter hosts and devices consistent with
the requirements of the SuperSpeed Universal Serial Bus Electrical
Compliance Test Specification Revision 0.5.
*1 See
host system requirements in Ordering Information section.
100% USB 3.0 Test Coverage
Compliance requirements per the
Electrical Compliance Test Specification Revision 0.5 for USB consist
of an Eye Diagram and Jitter (Random, Deterministic, and Total Jitter)
tests. However, the USB 3.0 base specification also includes a set
of informative measurements including tests for Spread Spectrum Clocking
(SSC), Slew, Voltage Levels, and others. The TekExpress option USB-TX
software is an easy-to-use software package that automates the USB
3.0 Normative and Informative Transmitter Tests. The DPOJET option
USB3 provides semi-automation of the USB 3.0 Normative and Information
Transmitter measurements and setup library. While other manufacturers
promote standard specific compliance software, the Tektronix solution
provides a comprehensive verification, characterization, debug, and
compliance environment. The Tektronix USB 3.0 test bench includes
a real-time oscilloscope (DPO/DSA70000B), a USB 3.0 test fixture set,
and USB 3.0 test software (USB-TX or USB3).
Required
test procedures (MOI) can be found at
http://www.tek.com/Measurement/applications/serial_data/usb.html
Automated Testing – Save Time and Resources
There
is no longer a need to be an expert on testing procedures. Remembering
the exact steps to take is time consuming and often requires going
back to the USB 3.0 Test Specification. USB-TX takes the guesswork
out of conducting USB 3.0 Transmitter Testing. Even if you remember
how to use the test equipment, it is common for even the most experienced
operators to forget steps in the procedure or to set up the correct
parameters, like applying the correct filters or clock recovery technique.
USB-TX allows engineers to simply select the desired tests to run
and work on other tasks while the tests are being executed.
Test Status
Configuration
Panel
Basic Operation
Simple Setup, Test Execution, and Reporting
Setup and test execution is simple with the TekExpress software.
The oscilloscope is controlled through the TekExpress automation framework.
The TekExpress software provides a Graphical User Interface (GUI)
and provides an intuitive workflow through setup and testing.
Setting up the Bench
When setting up a test, nothing can
be simpler than hooking up the test system by looking at a schematic.
View the schematic of the selected test with a push of a button.
Instrument Bench Discovery
TekExpress™ software automatically
(or on demand) scans and detects supported instruments connected in
your test bench (both Visa supported and non-Visa supported instruments),
whether they are connected through LAN, GPIB, or USB. A quick check
of the Instrument Bench menu confirms all instruments are networked
correctly.
One-button Testing
Once the test bench
is setup and the DUT is properly connected, simply press the Run button
to perform the selected test suite.
Show MOI
Online Help and Show MOI
Online Help is
available through the Help menu and direct access to the USB 3.0 Transmitter
MOI (Method of Implementation) through the Show MOI button. The approved
MOI documents step-by-step how the test is being performed by the
TekExpress™ software. This allows users to understand the theory behind
the measurements and better understand test results.
Pass/Fail
Report
The Report tab provides an view of test results along
with Pass/Fail status, test margin, and images supporting the test
results.
Powered by NI TestStand™
The TekExpress automated
compliance software uses NI (National Instruments) TestStand to manage
and execute its test sequences. A Windows user interface is provided
in the TekExpress software for simple and complete operation of compliance
measurements. However, if your validation and debug needs go beyond
the features offered by the TekExpress software, a full version of
NI TestStand can be used to develop higher-level automation sequences
to control the TekExpress software.
NI TestStand is the de
facto industry standard test management environment for automating
test and validation systems. NI TestStand is used to develop, manage,
and execute test sequences, as well as to integrate test modules written
in any test programming language through an open and flexible architecture.
Customers who own NI TestStand and purchase the TekExpress software
will be able to write scripts using NI TestStand that call the TekExpress
software with a limited command set. The limited command set allows
the NI TestStand user to recall and save TekExpress software setups,
start execution, query current execution status, and receive measurement
results.
For device validation, it’s often desirable to make
multiple runs of a single device using different operating conditions
such as temperature and power supply voltages. This is sometimes referred
to as ‘four-corners testing’, (testing to low-high temperature and
low-high supply voltages). For four-corners testing, NI TestStand
supports drivers for a wide range of temperature chambers and power
supplies. NI TestStand can be used to control the temperature chamber
and then call the TekExpress software for a compliance test using
the limited command set. For adjusting power supply voltages, the
power supply control sequence file within the TekExpress software
can be modified using a standard NI TestStand sequence file. Thus,
if your company already uses NI TestStand for automation, your test
engineers can incorporate commands to run the TekExpress compliance
software directly into their test sequences.
Characteristics
USB 3.0 Transmitter Testing
with USB3 Essentials
USB 3.0 Essentials DPOJET Measurements
and Setup Library (Opt. USB3) for the DSO/DSA70000B Series Oscilloscopes
provides a semi-automated USB 3.0 Transmitter solution. USB3 provides
a precise verification, characterization, and debug environment built
upon the general purpose analysis capabilities of DPOJET. USB3 enables
the execution of all USB 3.0 Normative and Informative Transmitter
Tests within a single test session as there is no limitation to the
number of tests that can be executed at once. A comprehensive analysis
environment is provided allowing the user to quickly compare the results
from multiple test configurations. For example, multiple Eye Diagrams
can be displayed at one time allowing the user to analyze the effects
of different clock recovery techniques or software channel models.
USB 3.0 requires the analysis of the Eye Diagram with and without
the transition bit. With DPOJET the user can easily compare the results
of both Eye Diagrams at the same time.
Transition and
Nontransition Bit Analysis
A supported configuration
includes a DPO/DSA70000B Series Digital Serial Analyzer (or other
supported oscilloscope) equipped with DPOJET (Jitter and Eye Diagram
Analysis Tools). The software requires a DPO/DSA70000B Series Digital
Serial Analyzer (greater than 8 GHz) with DPOJET (Opt. DJA).
USB 3.0 Transmitter Testing with USB-TX TekExpress™ Software
TekExpress Software (with Opt. USB-TX) provides automation of
the Tektronix USB 3.0 Transmitter Measurements MOI. A supported configuration
includes a DPO/DSA70000B Series Digital Serial Analyzer (or other
supported oscilloscope) equipped with DPOJET (Jitter and Eye Diagram
Analysis Tools). USB-TX also includes USB3 Essentials DPOJET Measurements
and Setup Library.
The following table outlines the key differences
between the USB3 and the USB-TX software solutions. USB3 Essentials
is included with USB-TX and thus all product features included with
USB3 Essentials are also included with USB-TX.
Table 1
– Key differences between USB3 Essentials and USB-TX
|
Feature
|
USB3 Essentials
|
USB-TX
|
|
Automatic measurement selections based on device type, test
type, test points, and selected probes
|
|
X
|
|
Automatic selection of Receiver CTLE filter
|
|
X
|
|
Automatic selection of TX Channel Modeling for Software Channel
Emulation
|
|
X
|
|
Complete coverage of USB 3.0 Normative and Informative Tests
(See Table 2)
|
X
|
X
|
|
Single-button execution for all selected measurements
|
X
|
X
|
|
Comprehensive debug environment allows isolation of spec violations,
editing of test limits
|
X
|
X
|
|
Detailed or Summary Reports
|
Detailed Only
|
Detailed and Summary
|
|
Automatically save test reports and waveforms
|
|
X
|
|
Re-analyze prerecorded waveforms
|
X
|
X
|
|
USB-specific user interface
|
|
X
|
|
Quickly move between precompliance and debug
|
|
X
|
Table 2 – Supported USB 3.0 Transmitter Measurements
|
Spec Reference
|
Parameter
|
Symbol(s)
|
|
Table 6-10
|
Unit Interval including SSC*2
|
UI
|
|
Table 6-8
Table 6-12
|
Tj - Dual Dirac at 10-12 BER*2
|
tTX—TJ-DD
|
|
Table 6-8
Table 6-12
|
Tx Deterministic Jitter – Dual Dirac*2
|
tTX—DJ-DD
|
|
Table 6-8
Table 6-12
|
Tx Random Jitter – Dual Dirac*2
|
tTX—RJ-DD
|
|
Table 6-9
|
SSC Modulation Rate
|
tSSC-MOD-RATE
|
|
Table 6-9
|
SSC Deviation
|
tSSC-FREQ-DEVIATION
|
|
Table 6-10
|
Differential p-p Tx Voltage Swing
|
VTX-DIFF-PP
|
|
Table 6-10
|
Low-power Differential p-p Tx Voltage Swing
|
VTX-DIFF-PP-LOW
|
|
Table 6-10
|
De-emphasized Output Voltage Ratio
|
Tx de-emphasis
|
|
Table 6-10
|
Maximum Slew Rate
|
tCDR_SLEW_MAX
|
|
Table 6-11
|
Tx Min Pulse
|
tMIN-PULSE-TJ
|
|
Table 6-11
|
Deterministic Min Pulse
|
tMIN-PULSE-DJ
|
|
Table 6-11
|
Transmitter Eye - Dual Dirac at 10-12 BER
|
tTX-EYE
|
|
Table 6-11
|
Transmitter DC Common-mode Voltage
|
VTX-DC-CM
|
|
Table 6-11
|
Tx AC Common-mode Voltage Active
|
VTX-CM-ACPP_ACTIVE
|
*2 Denotes normative tests, all other
tests are informative.
Required Equipment for USB 3.0 Transmitter
Testing
For a complete list of required equipment please visit
http://www.tek.com/Measurement/applications/serial_data/usb.html
