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Jitter and Eye-diagram Analysis Tools
DPOJET
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Features & Benefits
- Jitter and Timing Analysis
for Clocks and Data Signals
- Real-time Eye-diagram (RT-Eye™)
Analysis*1
- TekWizard™ Interface for One-button
and Guided Jitter Summaries
- Full Pass/Fail Limits and Mask
Testing with Comprehensive Standards Support Library; plus User Limit
and Mask Files allows Support of Custom Test Configurations and New
or Developing Standards
- Accurate Jitter Decomposition and
TJ(BER) Estimation*2 with Selectable Jitter Models Support
Popular Standards; Fibre Channel or PCI-Express Delta-Delta (Dual-Dirac)
and Convolved Results
- Nine Plot Types to View and Analyze
Jitter: Eye Diagram, CDF Bathtub, Spectrum, Histogram, Trend, Data,
Phase Noise, and Transfer Function
- Programmable Software
Clock Recovery including Software PLL*3
- User-selectable
Golden PLL Support for Popular Standards
- Selectable High-
and Low-pass Measurement Filters
- Selectable High- and Low-limit
Measurement Bounds Test
- Comprehensive Statistics Logging,
Reporting, and Remote Automation
- Capture and Save Worst-case
Signals for Detailed Analysis
Applications
- Characterize Performance
of High-speed Serial and Parallel Bus Designs
- Characterize
Clock and Data Jitter and Signal Integrity
- Characterize PLL
Dynamic Performance
- Characterize Modulation of Spread Spectrum
Clock Circuits
- Characterize Jitter Generation, Transfer,
and Tolerance
- Perform PHY Testing of PCI-Express, Serial
ATA, SAS, Fibre Channel, DisplayPort, DDR2, DDR3, USB 3.0, and other
Electrical and Optical Systems
*1 Patented
USPTO #6,836,738
*2 Patented USPTO #6,832,172, #6,853,933,
#7,254,168
*3 Patented USPTO #6,812,688
Real-time
Jitter and Eye-diagram Analysis
DPOJET is the premiere eye-diagram,
jitter, and timing analysis package available for real-time oscilloscopes.
Operating in the Tektronix DPO7000, DPO70000B, and DSA70000B Series
oscilloscopes, DPOJET provides engineers the highest sensitivity and
accuracy available in real-time instruments. With comprehensive jitter
and eye-diagram analysis and decomposition algorithms DPOJET simplifies
discovering signal integrity concerns and jitter and their related
sources in today's high-speed serial, digital, and communication system
designs.
Analog and digital designers in the computer, semiconductor,
and communications industries are facing new challenges as processor
clock speeds race beyond 3 GHz and back-plane bus and serial link
data rates exceed 8 GT/s. These increasing speeds mean reduced circuit
tolerance, or margin, for jitter and related signal integrity problems.
By using tools that help you rapidly characterize and discover sources
of jitter and signal integrity concerns, you can bring new designs
to market faster, with more confidence that they operate reliably
in today's ultra high-speed environment. Bringing new products to
market faster with higher reliability and higher performance means
greater opportunities for improving margins at your company.
Partial List of Measurements
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Measurement
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Description
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Period/Frequency Measurements
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Frequency, Period, N-Period, Cycle-Cycle Period, Positive
Width, Negative Width, Positive Duty Cycle, Negative Duty Cycle, Positive
Cycle-Cycle Duty, Negative Cycle-Cycle Duty
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Time Measurements
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Rise Time, Fall Time, High Time, Low Time, Setup, Hold, Skew
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Amplitude Measurements
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High, Low, High-Low, Common Mode, T/nT Ratio, Differential
Crossover
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Eye-diagram Measurements
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Eye Height, Eye Width, Width at BER, Mask Hits
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Jitter Measurements
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TIE, RJ, DJ, TJ(BER), PJ, DCD, DDJ, RJ(δ-δ), DJ(δ-δ), Phase
Noise
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Clock Recovery Methods
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Constant Clock Mean, Constant Clock Median, PLL, External,
PLL External
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Plots
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Histogram, Time Trend, Data Trend, Spectrum, Phase Noise,
Transfer Curve, Eye Diagram with Waveform Database, Eye-diagram Statistics
(CDF Bathtub)
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Limit and Mask Testing
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Pass/Fail Measurement Test Limits, Load and Test to Standard
Masks
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Measurement Source
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CH1 - CH4, MATH1 - MATH4, REF1 – REF4
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Data Logging
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Measurements, Statistics, Worst-case Waveform, and Snapshots
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Report Generation
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Export HTML Formatted Reports with Summary, Statistics, Plots,
and Pass/Fail
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DPOJET Jitter and Eye-diagram Analysis Tools extends
Tektronix’ real-time oscilloscopes capability, performing complex
measurements and analysis of clock, serial, and parallel data signals
captured in single-shot acquisition mode or in continuous-run acquisition
mode. Providing jitter and timing measurements with pass/fail parameter
testing, and eye diagrams with mask testing for today’s most common
industry standards, DPOJET is specifically designed to meet the advanced
measurement needs of today's high-speed digital designers in the computer
and communications industries.
DPOJET provides the ability
to make measurements of single-ended and differential signals, measurements
between two separate inputs, and measurements on multiple inputs simultaneously;
with each input and each measurement independently configurable for
maximum flexibility.
DPOJET supports displaying measurement
results and plots on the internal display, on an external monitor,
or both locations, thus making full use of the oscilloscope dual display
ports.
DPOJET analysis plots, like Spectrum and Trend, go beyond
simple measurements and results display. Trend analysis quickly shows
engineers how timing parameters change over time, like frequency drift,
PLL startup transients, or a circuit’s response to power supply changes.
Spectrum analysis quickly shows the precise frequency and amplitude
of jitter and modulation sources for easy, rapid identification. Finding
sources like adjacent oscillators and clocks, power-supply noise,
or signal crosstalk is no longer a tedious chore. Unique in the industry,
DPOJET also provides Phase Noise plots to show jitter in root/Hertz
and Transfer Function plots that allow direct comparison of jitter
spectrums between two signals of differing frequencies, providing
the perfect tool for determining jitter in PLL circuits like clock
multipliers.
DPOJET provides complete jitter and eye-diagram
analysis tools. With premiere measurement flexibility, oscilloscope
model support, limit testing, results logging and reporting, and integrated
remote programmability, DPOJET fully supports applications from device
and system debug and characterization to short-run functional test
and production.
Figure 1 – Spectrum,
Eye Diagram, and BER curve of SATA-2 3.0 Gbps MFTP
Characteristics
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Characteristic
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Description
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Jitter Noise Floor
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0.4 psRMS (typical with DSA72004B)
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Jitter Measurement Accuracy
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1.5 psRMS (typical with DSA72004B)
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Ordering Information
DPOJET Advanced
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Option
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DPO7000, DPO70000, or DSA70000 Series
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Opt. DJA
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Order preinstalled on a new oscilloscope
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Order an upgrade for existing oscilloscope:
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DPO7UP Opt. DJAM
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DPO7054, DPO7104, DPO7254, DPO7354
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DPO7UP Opt. DJAH
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DPO70604, DPO70804
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DPO7UP Opt. DJAU
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DPO71254, DPO71604, DPO72004
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DPO7UP Opt. DJUP
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DSA70000 Series
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DPOJET Essentials
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Option
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DPO7000 or DPO70000 Series
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Opt. DJE
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Order preinstalled on a new oscilloscope
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Order an upgrade for your existing oscilloscope:
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DPO7UP Opt. DJEM
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DPO7054, DPO7104, DPO7254, DPO7354
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Physical Characteristics
Software is supplied
on internal hard disk and on compact disk media. Software installs
and operators with DPO7000, DPO70000B, and DSA70000B Series oscilloscopes.
Online documentation and printable manual in PDF format are supplied
with the product.
Recommended Accessories
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Accessory
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Description
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Opt. DDRA
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DDR Memory Bus Analysis
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Opt. PCE
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PCI Express® Compliance Test Solution
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Opt. USB3
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USB 3.0 Automated Test Solution
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TriMode™ Probe
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P7520, 20.0 GHz Probe
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TriMode™ Probe
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P7516, 16.0 GHz Probe
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Differential Signal Acquisition System
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P7313SMA
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Arbitrary Waveform Generator
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AWG7122B, 24 GS/s AWG
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Product(s) are manufactured in ISO registered facilities.
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Product(s) complies with IEEE Standard 488.1-1987, RS-232-C,
and with Tektronix Standard Codes and Formats.
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61W-21170-3, 26-MAY-2009
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(WebID: 13555)
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