Digital Serial Analyzer Sampling Oscilloscope

Features & Benefits

• State-of-the-Art Sampling Oscilloscope for Communication Signal Analysis, TDR/TDT/Serial Data Network Analysis, Acquisition, and Measurements of Repetitive Ultrafast Signals
• Acquisition of Spread Spectrum Clocking (SSC) Signals
• Industry’s Only Mainframe to Support up to 8 Input Channels for Increased Flexibility and Throughput
• Four Color-graded, Variable Persistence Waveform Databases
• Measurement System with Over 100 Automated Measurements
• Complete Suite of Communications Measurements Includes Both Types of OMA, SSC Profile, and Many Others
• Automated ITU/ANSI/IEEE Mask Testing
• Masks and Measurements for SONET/SDH, FC, Ethernet, and Other Standards Built-in
• Mask Updates Can be Loaded from Factory-supplied File
• Mask Margin Testing for Guard Banding Production Testing
• Acquisition Modules
• Fully Integrated Multirate Optical Modules
• Optical Modules up to 80 GHz 80C10B
• High-accuracy "ER Calibrated" Measurement Available in Some Modules
• Electrical Modules up to 70+ GHz Bandwidth and 5 ps Measured Rise Time (10-90%)
• Flexible Rate Clock Recovery
• Clock Recovery with SSC (Spread Spectrum Clocking) Support Available
• Jitter, Noise, BER, and Serial Data Link Analysis
• Measures and Separates Deterministic Data Dependent Jitter from Random Jitter
• Measures Vertical Noise, Separating Deterministic Data Dependent Noise from Random Noise
• Highly Accurate BER and Eye Contour Estimation, Support for Latest Measurements - DDPWS, TWDP
• FFE/DFE Equalization, Transmitter Equalization
• Channel Emulation for Channels with >30 dB of Loss
• Linear Filter for Fixture De-embedding, Linear Filtering
• TDR (Time Domain Reflectometry)
• Up to 50 GHz TDR Bandwidth with 15 ps Reflected Rise Time and 12 ps Incident Rise Time
• Lowest Noise for Accurate Repeatable TDR Measurement Results – 600 μV_RMS at 50 GHz
• Independent Sampler Deskew Ensures Easy Fixture and Probe De-embedding
• Industry’s Only Mainframe to Accommodate up to Four True-differential TDR or Electrical Channel Pairs for Increased System Versatility
• S-parameters Measurements
• Up to 50 GHz Differential, Single Ended, Mixed Mode; Insertion, Return Loss, Frequency Domain Crosstalk
• PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing, and Standard Compliance Testing for Gigabit Signal Path and Interconnects – Including Eye Mask Tests
• Intuitive, Easy, and Accurate for Serial Data, Gigabit Digital Design, and Signal Integrity
• Fast and Accurate Automated Multiport S-parameter Measurements with Command Line Interface
• Industry’s Best Standard Timebase Jitter Performance, 800 fs_RMS
• Industry-leading Timebase Jitter Performance, <200 fs_RMS*¹ Available with Phase Reference Mode
• Fast Acquisition Rate and High Throughput
• True-differential Remote Sampler Enabling Placement Near DUT for Superior Signal Fidelity
• FrameScan™ Acquisition Mode with Eye Diagram Averaging:
• Isolate Data-dependent Faults
• Examine Low-power Signals
• MS Windows XP Operating System
• Advanced Connectivity to 3^rd party Software

Applications

• Design/Verification of Telecom and Datacom Components and Systems
• Manufacturing/Testing for ITU/ANSI/IEEE/SONET/SDH Compliance
• High-performance True-differential TDR Measurements
• Advanced Jitter, Noise, and BER Analysis
• Impedance Characterization and Network Analysis for Serial Data Applications Including S-parameters
• Channel and Eye Diagram Simulation and Measurement Based SPICE Modeling

*¹ Typical, with the Phase Reference Module, some conditions apply. Without the module, the jitter is <800 fs_RMS (typical).

Superior Performance with Extraordinary Versatility

For developing today’s high-speed serial devices, the DSA8200 Digital Serial Analyzer sampling oscilloscope is the most versatile tool for communication, computer and consumer electronics gigabit transmitter and signal path characterization, and compliance verification. With exceptional bandwidth, signal fidelity, and the most extensible modular architecture, the DSA8200 provides the highest performance TDR and interconnect analysis, most accurate analysis of signal impairments, and BER calculations for current and emerging serial data technology.

The DSA8200 provides unmatched measurement system fidelity with ultra-low jitter floor that ensures the most accurate acquisition of high-speed signals. You get advanced analysis benefits from the 200 fs acquisition jitter with the Phase Reference module. And in another step forward for a sampling oscilloscope, with the help of the Phase Reference module the DSA8200 can acquire and measure SSC (Spread Spectrum Clocking) signals.

The multiprocessor architecture, with dedicated per-slot digital signal processors (DSPs), provides fast waveform acquisition rates, reducing the test times necessary for reliable characterization and compliance verification.

The DSA8200’s versatile modular architecture supports a large and growing family of plug-ins enabling you to configure your measurement system with a wide variety of electrical, optical, and accessory modules that best suit your application now and in the future. With 6 module slots, the DSA8200 can simultaneously accommodate a clock recovery module, a precision Phase Reference module, and multiple acquisition modules, electrical or optical, so you can match system performance to your evolving needs.

Featuring industry-leading signal fidelity, the family of electrical modules includes bandwidth performance from 12 GHz to 70+ GHz. Two true-differential time domain reflectometer (TDR) modules, with remote samplers, offer up to 50 GHz bandwidth and 15 ps reflected rise time and 12 ps incident rise time. The family of low-noise variable bandwidth electrical modules provides the industry's best noise performance with remote samplers, featuring 450 μV_RMS noise at 60 GHz, and 300 μV_RMS at 30 GHz.

DSA8200 optical modules provide complete optical test solutions with superior system fidelity from 125 Mb/s to 43 Gb/s and beyond. The modules cover a range of wavelengths for both single- and multi-mode fibers. Each module can be optionally configured with a number of selectable data rate filters, optical reference receivers (ORR), and/or a full bandwidth path. The 80C07B, 80C08C, and 80C11 can be configured with a number of available flexible integrated clock recovery options. The 80C12 multirate module clock recovery support is achieved with an electrical output for use with the 80A05 or 80A07 Electrical Clock Recovery Modules.

The DSA8200’s popular FrameScan™ acquisition mode can be used with patterns from DUTs, BERTs, and other sources, to isolate pattern-dependent effects in transmitters or show the bit sequence preceding a mask violation. FrameScan automatically sequences the timebase so that each bit of the data stream is acquired in time order. When used in combination with mask testing conditional acquisition features of the DSA8200, such as stop after mask hits, FrameScan can automatically identify at which bit a pattern-dependent failure occurred.

In addition, specialized modules supporting features such as single-ended and differential electrical clock recovery, electrostatic protection for the TDR, and connectivity to the popular TekConnect probing system brings you the performance of Tektronix’ state-of-the-art probes for high-impedance and differential probing. Low-impedance probes for 50 Ω probing and for TDR probing are also available.

Jitter, Noise, BER, and Serial Data Link Analysis

80SJNB Jitter, Noise, BER, and Serial Data Link Analysis software package is a comprehensive application for serial data link analysis and for measurements of jitter and noise. Highly accurate BER estimation (based on both jitter and noise) impairments are built with accuracy higher than simple jitter-based bathtub estimation and with analysis capability unavailable on a BERT.

Available in the package also is a unique, state-of-the-art combination of FFE/DFE equalization, channel emulation, and fixture de-embedding tools. When combined with the DSA8200's modular flexibility, uncompromised performance, and unmatched system fidelity, this Serial Data Link Analysis (SDLA) toolbox provides the ideal solution for next-generation high-speed serial data design validation and compliance testing.

See the 80SJNB datasheet for more information.

TDR (Time Domain Reflectometry)

The DSA8200 is the industry’s highest performance fully integrated time domain reflectometry (TDR) measurement system. Offering true-differential TDR measurements up to 50 GHz bandwidth with 15 ps reflected rise time and 12 ps incident rise time, you are able to keep pace with today’s most demanding serial data network analysis (SDNA) requirements.

The new 80E10 and 80E08 TDR modules feature a fully integrated independent dual-channel 2-meter remote sampler system to minimize fixturing and assure optimal system fidelity. Independent sampler deskew ensures fast and easy fixture and probe de-embedding. The user can characterize differential crosstalk by using TDR steps from a differential module to drive one line pair while monitoring a second line pair with a second differential module.

TDR and electrical modules with fully integrated remote sampler.


Small form factor remote sampler enables placement near DUT assuring optimal signal fidelity.

The DSA8200 is the industry’s most versatile TDR measurement system, accommodating up to 4 dual-channel true-differential TDR modules for fast accurate multilane impedance characterization.

The P80318 True-differential TDR probe and P8018 Single-ended Passive Handheld TDR probe provide high-performance probing solutions for circuit board impedance and electrical signal characterization. The P80318, an 18 GHz 100 Ω input impedance differential TDR hand probe, enables high-fidelity impedance measurements of differential transmission lines. The adjustable probe pitch enables a wide variety of differential line spacing and impedances. The P8018 is a 20 GHz Single-ended Passive Handheld TDR probe. Both the P80318 and P8018 can be used as standalone probes but are especially designed to work with the 80A02 for the control of EOS/ESD protection.

Gigabit Signal Path Characterization and Analysis - Serial Data Network Analysis (SDNA)

As clock speeds and rise times of digital circuits increase, interconnect signal integrity dramatically affects digital system performance. Accurate and efficient serial data network analysis (SDNA) of the signal path and interconnects in time and frequency domains is critical to predict signal losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye diagram degradation, ensuring reliable system operation.

Tektronix offers several true-differential TDR modules, which in combination with IConnect^® software, allow S-parameters measurements with up to -70 dB of dynamic range. This performance assures accurate repeatable measurement in serial data analysis, digital design, signal integrity, and electrical compliance testing applications.

The table below summarizes the S-parameter measurement bandwidth performance when IConnect and the true-differential TDR modules are used in combination.

With the long record length acquisitions, IConnect^® provides great flexibility for obtaining the desired frequency range and frequency step when performing S-parameter measurements. Up to 1,000,000 points can be acquired*².

When you employ IConnect^® Signal Integrity TDR and S-parameter software with the DSA8200 you have an efficient, easy-to-use, and cost-effective solution for measurement-based performance evaluation of multi-gigabit interconnect links and devices, including signal integrity analysis, impedance, S-parameter and eye diagram tests, and fault isolation. IConnect can help you complete interconnect analysis tasks in minutes instead of days, resulting in faster system design time and lower design costs. IConnect also enables impedance, S-parameters, and eye diagram compliance testing as required by many serial data standards, as well as full channel analysis, Touchstone (SnP) file output, and SPICE modeling for gigabit interconnects.

*² Long record lengths are supported only on DSA8200, CSA8200, TDS8200, CSA8000, and TDS8000 platforms.

Failure Analysis – Quickly Identify Fault Location

The 80E10 provides superior resolution enabling the fastest and most efficient fault isolation in package, circuit board, and on-chip failure analysis applications.

Quickly identify the exact location of faults with the 80E10’s sub-millimeter resolution and IConnect True Impedance Profile.

Advanced Communication Signal Analysis

Specifically designed for ultra-high-performance optical and electrical serial data applications, the DSA8200 is the ideal tool for design characterization and validation, as well as manufacturing test of datacom and telecom components, transceiver subassemblies, and transmission systems. The DSA8200 generates measurement results, not just raw data, with time and amplitude histograms, mask testing, and statistical measurements. It provides a communications-tailored measurement set that includes jitter, noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor, mean optical power, and amplitude. In addition, you can do mask testing of SONET/SDH, 100 Gigabit (4x25), 10 Gigabit, Gigabit Ethernet, and other electrical and optical standards compliance verification. Color grading and grayscale grading of waveform data adds a third dimension, sample density, to your signal acquisitions and analyses to provide visual insight. In addition, the variable persistence database feature enables exact data aging to all of the functions, and facilitates eye measurements on DUTs under adjustment.

OpenChoice Software Enables Familiar Tools to Extend Your Measurement System

The DSA8200 provides an open Windows environment offering new levels of data analysis on the instrument using your favorite commercially available third-party software packages. Additionally, TekVISA™, a standard software accessory, allows the instrument to be placed under the control of software applications (such as LabVIEW, LabWindows, Visual Basic, Microsoft Excel, C, etc.) running on the instrument or on external PC workstations network connected to the instrument without the need of a GPIB hardware interface. Plug-and-play drivers for LabVIEW and other programs are also supplied.

The DSA8200 combines the familiarity of Microsoft's Windows XP operating system with world-class waveform acquisition technology. This platform provides a wide array of standard instrumentation and communications interfaces, including: GPIB, parallel printer port, RS-232-C, USB serial ports, and an Ethernet LAN connection. In addition, the platform includes a DVD-CD/RW combo drive and removable hard drive for storage of waveforms, setups, and analysis results.

155 Mb/s to 12+ Gb/s Optical Test

Tektronix optical modules for DSA8200 offer highest level of integration in the industry, with corresponding higher repeatability and transferability of the result. A particularly method-sensitive measurement, Extinction Ratio (ER) is now also available as ER Calibrated, with additional layer of improvement to the portability of the result (80C08C and 80C11 modules only).

80C08C 10 GHz Broad Wavelength Multirate 10 Gb/s Optical Module

The 80C08C is a broad wavelength (700 to 1650 nm) multirate optical sampling module providing datacom rate testing for 10GbE applications at 9.95, 10.31, 11.09 Gb/s and 10G Fibre Channel applications at 10.51 Gb/s. The 80C08C also provides telecom rate testing with several filters between 9.95 and 11.3 Gb/s. With its amplified O/E design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low power level optical signals. The 80C08C can be optionally configured with clock recovery options that can support any standard or user-defined rate in a continuous range from 9.8 to 12.6 Gb/s.

80C12 Up to 10 GHz Broad Wavelength Multirate 1 Gb/s to 10 Gb/s Optical Module

The 80C012 is a broad wavelength (700 to 1650 nm) multirate optical sampling module providing 1G, 2G, and 4G telecom and datacom testing. This highly flexible module can be configured to support either lower data rate applications (1 to 4 Gb/s) or a wide variety of 10 Gb/s applications. The low data rate applications include: 1, 2, 4, and 8 Fibre Channel and “by 4” wavelength division multiplex standards such as 10G Base-X4 and 4-Lane 10 Gb/s Fibre Channel. The supported 10 Gb/s applications include both datacom and telecom. The supported 10 Gb/s datacom applications include 10GbE at 9.95, 10.31, 11.09 Gb/s, 8G Fibre Channel, and 10G Fibre Channel applications at 8.5 Gb/s, 10.51, and 11.3 Gb/s. The 80C12 also provides telecom rate testing at 9.95, 10.66, and 10.70 Gb/s. With its amplified O/E design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low power level optical signals. Clock recovery for the 80C12 is provided through the 80A05 or 80A07 clock recovery modules (sold separately).

80C11 30 GHz Long Wavelength Multirate 10 Gb/s Optical Module

The 80C11 is optimized for testing of long wavelength signals (1100 to 1650 nm) at a number of rates around 10 Gb/s with a highly flexible multirate filter. Additionally the high optical bandwidth of 30 GHz (typical) and the excellent frequency response of its full bandwidth path is well suited for general-purpose high-performance optical component testing. The 80C11 can be configured with clock recovery options that supports any standard or user-defined rate from 9.8 to 12.6 Gb/s.

80C07B 2.5 GHz Broad Wavelength Multirate 155 Mb/s to 2.5 Gb/s Optical Module

The 80C07B is a broad wavelength (700 to 1650 nm) multirate optical sampling module optimized for testing datacom/telecom signals from 155 to 2500 Mb/s. With its amplified O/E design, this module provides excellent signal-to-noise performance, allowing users to examine low-power optical signals. The 80C07B can be optionally configured with multirate clock recovery that operates from 155 to 2.7 Mb/s.

40 Gb/s and 100 Gb/s Optical Test

80C10B Multirate Datacom and Telecom 40 Gb/s and 100 Gb/s

The 80C10B module provides integrated and selectable reference receiver filtering, enabling compliance testing at either 1310 nm or 1550 nm for 39.813 Gb/s (OC-768/STM-256), 41.25 Gb/s (40GBase-LR), and 43.018 Gb/s [OTU3, (4x10G LAN PHY)] rates. In addition to the filter rates, the user may also choose selectable bandwidths of 30 GHz, 65 GHz, and 80 GHz for 80C10B for optimal noise vs. bandwidth performance for accurate signal characterization. The 80C10B is optionally available with Option F1 which extends filter selections to include

 

27.739 Gb/s (100GBase-LR4 + FEC and 100GBase-ER4 + FEC), and 25.781 Gb/s (100GBase-LR4 and 100GBase-ER4 ). The 80C10B is also optionally available in a bundled ordering configuration which includes a 70+ GHz electrical sampling channel.

80C25GBE Multirate Datacom 100 Gb/s

80C25GBE module provides 65 GHz full bandwidth with integrated selectable reference receiver filtering, enabling compliance testing at either 1310 nm or 1550 nm for 27.739G (100GBase-LR4+FEC and 100GBase-ER4+FEC), and 25.781G (100GBase-LR4 and 100GBase-ER4).

Optical Modules: 80C07B

*³ 125 Mb/s is supported by selecting 155 Mb/s rate.

Optical Modules: 80C08C, 80C10B, 80C11, and 80C25GBE

Optical Modules: 80C12

*⁴ With 80A05 or 80A07.

*⁵ With 80A05 Option 10G or 80A07.

*⁶ Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available for 80C12 Option 10G modules only; and is identified as 10BASE-R.

DSA8200 Electrical Modules

TDR Modules: 80E10, 80E08, and 80E04

The 80E10, 80E08, and 80E04 are dual-channel time domain reflectometry (TDR) sampling modules, providing up to 12 ps incident and 15 ps reflected rise time. Each channel of these modules is capable of generating a fast impulse for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The polarity of each channel’s step can be selected independently. This allows for true-differential or common-mode TDR or S-parameters testing of two coupled lines, in addition to the independent testing of isolated lines. The independent step generation for each channel allows true-differential measurements, which ensures measurement accuracy of nonlinear differential devices.

80E10 and 80E08 feature a small form factor, fully integrated independent 2-meter remote sampler system, enabling the location of the sampler near the DUT for the best system fidelity. The modules characterize crosstalk by using TDR steps to drive one line (or line pair for differential crosstalk) while monitoring a second line (or line pair) with the other channel (or another module for differential crosstalk). The "rise time filter" function on the DSA8200 mainframe can be used with TDR or crosstalk measurements to characterize expected system performance with slower edge speeds. An optional 2-meter extender cable for the 80E04 is available, which enables placement of the module near the DUT for the best system fidelity.

All modules have independent incident step and receiver deskew to remove the affect of fixtures and probes, enabling faster and easier deskew. The 80E10 sampling module provides an acquisition rise time of 7 ps, with up to 50 GHz user-selectable equivalent bandwidth (with 50 GHz, 40 GHz, and 30 GHz settings). 80E08 sampling bandwidth is 30 GHz (user-selectable with 30 GHz and 20 GHz settings) and 80E04 sampling bandwidth is 20 GHz. The 20 GHz P8018 single-ended and the 18 GHz P80318 differential variable pitch TDR handheld probes provide excellent performance, ensuring easy and accurate backplane and package measurements.

TDR Module Summary

*⁷ Values shown are warranted unless printed in an italic typeface which represents a typical value.

*⁸ Calculated from .35 bandwidth rise time product.

Electrical Modules: 80E09, 80E07, 80E06, 80E03, and 80E01

The 80E09 and 80E07 are dual-channel modules with remote samplers, capable of noise as low as 450 μV_RMS at 60 GHz bandwidth and 300 μV_RMS noise at 30 GHz bandwidth. Each small form factor remote sampler is attached to a 2-meter cable to minimize the effects of cables, probes, and fixtures to ensure the best system fidelity. User-selectable bandwidth settings (60/40/30 on 80E09 and 30/20 on 80E07) offer optimal noise/bandwidth trade-off.

80E06 and 80E01 are single-channel 70+ and 50 GHz bandwidth sampling modules respectively. 80E06 provides the widest bandwidth and fastest rise time with world-class system fidelity. Both 80E06 and 80E01 provide a superior maximum operating range of ±1.6 V. Both modules can be used with the optional 2-meter extender cable, ensuring superior system fidelity and measurement flexibility.

The 80E03 is a dual-channel 20 GHz sampling module. This module provides an acquisition rise time of 17.5 ps or less. An optional 2-meter extender cable is available.

When used with Tektronix 80SJNB Jitter, Noise, and BER Analysis software, these modules enable separation of both jitter and noise into their constituent components, for insight into the underlying causes of eye closure and obtain highly accurate calculation of BER and 3-D eye contour. When used with 82A04 phase reference module, timebase accuracy can be improved down to 200 fs_RMS jitter which, together with the 300 μV_RMS noise floor and 14 bits of resolution, ensures the highest signal fidelity for your measurements.

Electrical Module Summary

*⁷ Values shown are warranted unless printed in an italic typeface which represents a typical value.

*⁹ Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series mainframes.

DSA8200 Accessory Modules

82A04 Phase Reference Module

The 82A04 Phase Reference Module enhances the DSA8200 sampling oscilloscope from the industry's standard timebase jitter performance of 800 fs_RMS, to the extremely low timebase jitter of <200 fs_RMS. Typical application for the Phase Reference module is the acquisition and analysis of very high-speed optical and electrical signals in communication devices and systems. The 82A04 supports both the Triggered mode of operation, which is similar to usual acquisition, and the untriggered Free Run mode where all timing information comes from the customer-supplied clock alone (no trigger signal necessary). When the external clock is not available the module can accept the clock signal from the clock recovery output of the 80Cxx modules, as well as from the 80A05 or 80A07 clock recovery modules. Additionally 82A04 supports SSC (Spread Spectrum Clocking) operation.

80A05 Electrical Clock Recovery Module

The 80A05 Electrical Clock Recovery Module enables clock recovery for electrical signals, as well as internal triggering on the recovered clock. The module recovers clocks from serial data streams for all of the most common electrical standards in the 50 Mb/s to 4.25 Gb/s, around 5 to 6 Gb/s, and from 9.953 Gb/s to 12.5 Gb/s ranges. The module accepts either single-ended or differential signals as its input, providing clock recovery for both. The signal(s) is/are then passed on to the output connectors (at about 50% of the input level) and can be connected to sampling module(s) for differential or single-ended sampling. Option 10G is required for support of standard rates from 9.953 Gb/s to 12.6 Gb/s. The 80A05 and 80A07 can also serve as the clock recovery module for the 80C12 Optical Sampling Module.

80A06 PatternSync Module

The 80A06 PatternSync Trigger Module, when used in combination with 80SJNB software, enables characterizing jitter, noise, and BER performance of high-speed serial designs from 1 Gb/s to 60 Gb/s data rates. It extends the capability of the DSA8200 sampling oscilloscope by creating a pattern trigger from any data-related clock – a recovered clock, user-supplied clock, sub-clock, or super-clock. The PatternSync Trigger Module is programmable to pattern lengths of up to 2²³ bits and accepts a user-supplied clock signal from 150 MHz to 12.5 GHz. The 80A06 module is required with the DSA8200 when using 80SJNB Advanced Jitter, Noise, and BER Analysis software package. This module can be used in combination with the 82A04 Phase Reference module for the best timebase accuracy or for acquisition of signals under SSC (Spread Spectrum Clocking).

80A07 Clock Recovery Module

80A07 recovers clocks from serial data streams for all of the most common electrical standards in the continuous 100 Mb/s to 12.5 GB/s range. Auto-locking capability is selectable from the user interface or programmatic interface, so the design and test engineers can search and lock onto signals of undefined or unknown data rate. The module accepts either single-ended or differential signals as its input, providing clock recovery for both. The signal(s) is/are then passed on to the output connectors and can be connected to sampling module(s) for differential or single-ended sampling. 80A07 offers complete configurability and state-of-the-art specifications and is the preferred solution for most serial data standards due to excellent stability, superior jitter and slew rate tolerance for recovering clocks from stressed or degraded signals, and unequaled PLL bandwidth and roll-off shape control for either Golden PLL compliance testing or custom PLL response. 80A07 also locks on spread-spectrum signals. The 80A07 can also serve as the clock recovery module for the 80C12 Optical Sampling Module.

P80318 Differential Handheld TDR Probe

The P80318 is an 18 GHz 100 Ω input impedance differential TDR hand probe. This probe enables high-fidelity impedance measurements of differential transmission lines. The adjustable probe pitch from 0.5 mm to 4.2 mm enables a wide variety of differential line spacing and impedances. The P80318 probe also includes two precision SMA cables with parallel control lines that provides the 80A02 module the control for EOS/ESD protection.

P8018 Single-ended Handheld TDR Probe

The P8018 Handheld TDR Probe is a 20 GHz, 50 Ω input impedance, single-ended passive probe that provides a high-performance solution for electrical sampling, TDR circuit board impedance characterization, and high-speed electrical signal analysis applications. The P8018 probe also includes a precision SMA cable and parallel control line that provides the 80A02 module the control for EOS/ESD protection.

80A02 EOS/ESD Protection Module

The 80A02 EOS/ESD Protection module protects the sampling bridge of Tektronix electrical sampling module inputs from damage by electrostatic charge. The 80A02 is intended for use in applications such as electrical TDR circuit board testing and cable testing where large static charges can be stored in the DUT.

When used with the matching P8018 20 GHz single-ended handheld probe or the P80318 differential handheld probe (both with probe tip pressure actuating feature) the 80A02 provides a superior technique and performance capability for electrical module EOS/ESD protection of acquired electrical signals and TDR measurements (two 80A02 modules required for differential applications).

80A03 TekConnect Probe Interface Module

The 80A03 provides probe power and control for up to two Tektronix P7000 Series probes. The 80A03 is powered through the oscilloscope and requires no user adjustments or external power cords. An electrical sampling module can be plugged directly into the slot on the 80A03 to provide the optimum system fidelity and a short electrical path. Using the 80A03 designers can benefit from Tektronix' industry-leading active and differential probes to measure signals on SMD pins and other challenging circuit features.

SlotSaver Small Module Extender Cable

This cable can be used to power and operate one 80A01*⁹, 80A02, or 80A06 accessory modules, eliminating the need to consume a small form factor mainframe slot. The SlotSaver extender cable plugs into the ‘Trigger Power’ connector on the mainframe or (for 80A01 and 80A02) into the ‘Probe Power’ connector on most electrical sampling modules.

*⁹ Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series mainframes.

DSA8200 Application Software

80SJNB Jitter, Noise, BER, and Serial Data Link Analysis (SDLA) Software

80SJNB speeds the identification of the underlying causes of both horizontal and vertical eye closure through separation of jitter and noise. With its unique insight into the constituent components of both jitter and noise, 80SJNB provides a highly accurate and complete BER calculation and eye contour analysis.

Additionally available in the software package is the first-ever set of features addressing the design issues of modern Serial Data Links: equalization with either FFE or DFE, channel emulation, support for fixture de-embedding, as well as full support for SSC – Spread Spectrum Clocking. When you combine Jitter, Noise, and BER analysis with the DSA8200 modular flexibility, uncompromised performance, and unmatched signal fidelity you get the ideal solution for next-generation high-speed serial data design validation and compliance testing. 80SJNB requires the 80A06 PatternSync module, which creates a trigger pulse on each complete pattern. 80SJNB may be used with the 82A04 phase reference module for enhanced accuracy or for SSC signals, or without it depending on your requirements. SSC max. amplitude 5000 ppm (6000 ppm) at 30 ±3 kHz. Current version V2.1 of 80SJNB supports save and recall of the complete signal description. Also added is a new measurement DDPWS (Data Dependent Pulse Width Shrinkage) and a corresponding graph. 80SJNB also supports the Transmitter Waveform Dispersion Penalty (TWDP) measurement (download the free U80TWDP_LRM utility from www.tektronix.com).

80SJNB Jitter and Noise Analysis Measurements

Jitter Analysis

80SJNB Noise Analysis

New: 80SJNB Advanced Supports:

• FFE (Feed Forward Equalization) to 100 Taps
• DFE (Decision Feedback Equalization) to 40 Taps
• Filter for Support of Linear Filters from Fixture De-embed to Transmitter Equalization. Channel Emulation supported for channels with >30 dB of loss at 1^st harmonic frequency

IConnect^® Signal Integrity TDR and S-parameter Software

Operating on the DSA8200 TDR platform, IConnect^® S-parameters is the most cost-effective and highest throughput approach for S-parameter measurements in digital design, signal integrity analysis, and interconnect compliance testing, providing as much as 50% cost savings compared to similar bandwidth VNAs, and dramatically speeding up measurements. You can also take advantage of IConnect^® S-parameters command line interface, which automates the S-parameter measurements, to the overall suite of manufacturing tests you perform using your TDR instrument, significantly reducing test time while increasing measurement repeatability.

The simplicity of S-parameter calibration using a reference (open, short, or through), and an optional 50 Ω load makes the measurement, fixture de-embedding, and moving the reference plane a snap. Touchstone file format output enables easy S-parameter file sharing for further data analysis and simulations.

Tektronix offers several true-differential TDR modules, which in combination with IConnect^® offers S-parameter measurements to 50 GHz with up to -70 dB of dynamic range. This performance exceeds requirements for serial data analysis, digital design, and signal integrity applications, resolving down to 1% (-40 dB) accuracy of crosstalk, whereas electrical compliance testing masks typically call for the measurements in the -10 to -30 dB range.

IConnect^® software allows you to quickly and easily generate SPICE and IBIS models for your PCBs, flex boards, connectors, cables, packages, sockets, and I/O buffer inputs directly from TDR/T or VNA S-parameter measurements. IConnect^® allows you to display eye diagram degradation, jitter, loss, crosstalk, reflections, and ringing in your digital system. IConnect^® Linear Simulator allows the designer to link several interconnect channels together to evaluate the total time, frequency domain performance, and eye diagram of the overall channel. IConnect^® substantially simplifies the signal integrity analysis of the interconnect link, equalization and emphasis component design, and analysis of the interconnect link with transmitter and receiver.

Characteristics

Signal Acquisition

Acquisition Modes

Acquisition Characteristics

*¹⁰ When using the 82A04 Phase Reference Module.

*¹¹ Traditional mode - not using the 82A04 Phase Reference module.

Trigger System

Trigger Sources

External direct trigger.

External pre-scaled trigger.

Internal clock trigger: Internally connected to direct trigger.

 

Clock recovery triggers from optical sampling modules and from the 80A05 or 80A07 electrical clock recovery modules; signal from the 80A05 module (pre-scaled above 2.7 Gb/s) internally connected.

Phase Reference*¹⁰ timebase supports acquisitions without a trigger signal in its Free Run mode.

*¹⁰ When using the 82A04 Phase Reference Module.

*¹² When using the 82A04 Phase Reference module performance under SSC is lower and depends on modulation shape, clock recovering setting, and cabling lengths.

Display Features

Math/Measurement

*⁶ Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available for 80C12 Option 10G modules only; and is identified as 10BASE-R.

Optical Sampling Module Characteristics

Refer to Optical Sampling Modules User Manual for more detailed information.

Optical Sampling Module Characteristics

*⁶ Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available for 80C12 Option 10G modules only; and is identified as 10BASE-R.

*¹³ Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical filters valid for OMA ≤ 500 uW (1550/1310 nm), OMA ≤ 860 uW (850 nm), OMA ≤1020 uW (780 nm).

Note: Refer to Optical Sampling Modules User Manual for more detailed information.

Optical Sampling Module Characteristics (Cont.)

*¹³ Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical filters valid for OMA ≤ 500 uW (1550/1310 nm), OMA ≤ 860 uW (850 nm), OMA ≤1020 uW (780 nm).

Optical Sampling Module Characteristics (Cont.)

Optical Sampling Module Characteristics (Cont.)

*¹⁴ Smallest power level for mask test. Values represent theoretical typical sensitivity of NRZ eyes for comparison purposes. Assumes instrument peak-peak noise consumes most of the mask margin.

Optical Sampling Module Characteristics (Cont.)

*¹⁵ Low ER signals ( ER ≤ 6 dB): signal passes 802.3ae-like mask (scaled horizontally for bit rate); 10⁵ samples in mask. High ER signals ( ER > 6 dB): signal passes OC-192-like mask (scaled horizontally for bit rate); 10⁵ samples in mask.

TDR System (80E10, 80E08, 80E04 only)

Physical Characteristics

Electrical Sampling Module Characteristics

*⁸ Calculated from .35 bandwidth rise time product.

*¹⁶ Values shown are warranted unless printed in an italic typeface which represents an unwarranted characteristic value that the instrument will typically perform to.

*¹⁷ User selectable.

Electrical Sampling Module Characteristics (continued)

*⁸ Calculated from .35 bandwidth rise time product.

*¹⁸ Calculated from formula rise time = 0.35/(typical bandwidth).

Electrical Sampling Module Characteristics (continued)

*⁷ Values shown are warranted unless printed in an italic typeface which represents a typical value.

*¹⁸ Calculated from formula rise time = 0.35/(typical bandwidth).

S-parameter Performance Characteristics (80E10)

Measurement Conditions

• All measurements were performed after proper warm up as specified in the DSA8200 manual
• Standard S-parameter dynamic range measurement practices were used to determine the dynamic range of the module
• Uncertainty results were derived from a wide range of devices, with 250 averages
• Better dynamic range can be achieved by selecting lower bandwidth settings on the 80E10 module due to lower RMS noise floor
• Results apply to single-ended or differential measurements

Dynamic Range

 

 

 

 

 

 

 

 

 

 

 

 

 

Uncertainty

Physical Characteristics for Electrical Sampling Modules

*¹⁹ Remote module characteristics.

80A05 and 80A07 Electrical Clock Recovery Module

*⁶ Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available for 80C12 Option 10G modules only; and is identified as 10BASE-R.

*²⁰ The standard is not enumerated but is supported as a custom rate.

*²¹ No spread spectrum clocking support.

DSA8200 Mainframe Physical Characteristics

Computer System and Peripherals

Input/Output Ports

Operating Requirements

Ordering Information

DSA8200 Digital Serial Analyzer Sampling Oscilloscope

Includes: User manual, quick reference card, MS Windows XP compatible keyboard and mouse, touch screen stylus, online help, programmer online guide, power cord.

With OpenChoice™ software, Tektronix provides enhanced test and measurement analysis with the capability of full integration of third-party software on the open Windows oscilloscopes. By working with the industry leaders, National Instruments and The MathWorks, examples of software programs from these companies are featured on all Tektronix open Windows oscilloscopes.

Options

Service Options

International Power Plug Options

Other Accessories

Interconnect Cables (3^rd Party)

Tektronix recommends using quality high-performance interconnect cables with these high-bandwidth products in order to minimize measurement degradation and variations. The W.L. Gore and Associates' cable assemblies listed below are compatible with the 2.92 mm, 2.4 mm, and 1.85 mm connector interface of the 80Exx modules. Assemblies can be ordered by contacting Gore by phone at (800) 356-4622, or on the web at www.gore.com/tektronix

Calibration Kits and Accessories (3^rd Party)

To facilitate S-parameter measurements with the new 80E10, 80E08, and 80E04 electrical TDR modules and IConnect^® software, we recommend precision calibration kits, adapter kits, connector savers, airlines, torque wrenches, and connector gauges from Maury Microwave. These components, accessible at www.maurymw.com/tektronix.htm, are compatible with the 2.92 mm, 2.4 mm, and 1.85 mm connector interface of the 80Exx modules. Cal kits and other components can be ordered by contacting Maury Microwave.

Interconnect Cables