Overcoming High Speed Serial Data RX Testing Challenges Using an AWG and Direct Synthesis

With digital data prevalent in all forms of consumer products today, High Speed Serial Data testing is one of the biggest challenges for the design and testing of these popular devices. Manufacturers and designers must test products and designs to ensure final products can handle real world conditions. This application note focuses on DisplayPort, but the techniques are applicable to PCI Express, SATA, HDMI, and many more.