Understanding and Performing USB 2.0 Physical Layer Testing
USB 2.0 technology has been widely adopted in today's marketplace and introduces a 40-times increase in data rates. This increase in throughput brings new compliance requirements. This application note will focus on understanding and performing USB 2.0 physical layer measurements and electrical compliance testing (electrical and high-speed tests) and will include a discussion of the instruments required for each test. |
Download File (1 MB)
55W-15027-3
(WebID: 2161), 10-Mar-2009
Navigate Application Notes and Technical Documents
Application Notes and Technical Documents
> Applications
> Serial Data
> High-speed Serial Technologies
> USB
Application Notes and Technical Documents
> Products
> Accessories
> Oscilloscope Accessories
> Oscilloscope Application Software
Application Notes and Technical Documents
> Products
> Oscilloscopes
> Oscilloscopes 500MHz to 5GHz
> DPO7000 Series
Application Notes and Technical Documents
> Products
> Oscilloscopes
> Oscilloscopes up to 500MHz
> DPO7000 Series
Tektronix documents require the latest version of
Adobe Acrobat Reader.
|
