Jitter Generation Techniques for Serializer-Deserializer Compliance Testing
New serial data standards and platforms are emerging continuously, and with them the requirement for effective compliance and characterization measurement tools. Of particular interest to digital designers are solutions for measuring jitter in Serializer-Deserializer (SerDes) and Clock and Data Recovery (CDR) circuits. |
Download File (2 MB) 12 Pages
86W-18568-1
(WebID: 2384), 01-Jan-2005
Navigate Application Notes and Technical Documents
Application Notes and Technical Documents
> Products
> Signal Generators
> Logic Sources
> DTG5000 Series
Application Notes and Technical Documents
> Applications
> RF Test
> EMI / EMC
Application Notes and Technical Documents
> Applications
> RF Test
> Radio / Satellite Communications
Application Notes and Technical Documents
> Applications
> RF Test
> Radar / Electronic Warfare
Application Notes and Technical Documents
> Applications
> RF Test
> Radio / Satellite Comms
Tektronix documents require the latest version of
Adobe Acrobat Reader.
|
