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Active Voltage Probes

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TriMode™ Probe Architecture (WebID: 6498): TriMode™ Probe Architecture White Paper (51Z-20874-0)	White Paper	19-Jan-2009
Tektronix Oscilloscope Accessories Selection Guide (WebID: 2867): Tektronix oscilloscope probes and accessories allow you to adapt your oscilloscope to your specific application needs and environment. (20 Pages, 60W-14232-5)	Application Note	20-Nov-2007
Utilizing DSP to Optimize Real-time Oscilloscope/Probe System Performance (WebID: 11842): The combination of DSP and advances in hardware and ASIC design have enabled significant advances in probe signal fidelity. (8 Pages, 55W-20957-0)	Application Note	12-Sep-2007
TekVPI™ Technology Delivers Versatility and Ease-of-Use in a New Probe Interface Architecture (WebID: 3386): Introduces the next generation of Tektronix probe interface architecture designed for use with Tektronix newest generation of DPO4000 and mid-range DPO7000 Series DPO™ oscilloscope. (51W-19045-0)	Technical Brief	14-Feb-2006
TekConnect™ Probes: Signal Fidelity Issues and Modeling (WebID: 2361): This technical brief describes specific signal integrity challenges in high performance designs and the signal fidelity issues that affect the accurate representation of a signal in a measurement system. (28 Pages, 60W-15661-1)	Technical Brief	20-May-2004
ABCs of Probes (WebID: 2329): In essence, the probe is the first link in the oscilloscope measurement chain. In this primer, you'll learn what contributes to the strengths and weaknesses of probes and how to select the right probe for your application. (60W-6053-10)	Primer	01-Jan-2004
High-speed Differential Data Signaling and Measurements (WebID: 2162): This application note examines the use of differential signaling in high-speed serial data links together with a review of differential measurement techniques, with a special focus on the use of high bandwidth differential probes. (36 Pages, 55W-16761-0)	Primer	01-Sep-2003
The Effect of Probe Input Capacitance On Measurement Accuracy (WebID: 2336): Probing an ECL circuit with series termination using a passive probe (trace T3 and T4) and an active FET probe (traces T1 and T2). (4 Pages, 60W-8910-1)	Technical Brief	01-Oct-1996

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