Total files found 9. Displaying 1 to 9
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All About the Acronyms: RJ, DJ, DDJ, ISI, DCD, PJ, SJ, … (WebID: 12839):
In this paper, we define the categories and types of jitter, their origins and interrelationships, and how they can be used to diagnose and debug system hardware. (12 Pages, 55W_21989_0) |
White Paper |
08-Apr-2008 |
Clock Recovery in Serial-Data Systems (WebID: 12843):
This paper reveals the key features of clock recovery that affect the bit error ratio, namely bandwidth and peaking – including which part of the jitter spectrum matters most. (7 Pages, 55W_21991_0) |
White Paper |
08-Apr-2008 |
Jitter Analysis in Systems with Crosstalk (WebID: 12840):
In this paper we introduce crosstalk as an example of a jitter source that doesn’t fall conveniently under one of the standard jitter acronyms and presents a challenge that can be addressed by expanding from jitter analysis to the full two dimensions of phase noise and amplitude noise. (10 Pages, 55W_21990_0) |
White Paper |
08-Apr-2008 |
Reference Clock Jitter and Data Jitter (WebID: 12844):
This paper shows how reference clock jitter affects data jitter at each point in the system and describes techniques for its analysis. (8 Pages, 55W_21992_0) |
White Paper |
08-Apr-2008 |
The Meaning of Total Jitter (WebID: 12836):
This paper clarifies the meaning of TJ and shows how measurements of jitter subcomponents, like Random Jitter (RJ) and Deterministic Jitter (DJ), can be used to provide fast accurate estimates of TJ(BER). (10 Pages, 55W_21987_0) |
White Paper |
08-Apr-2008 |
What the Dual-Dirac Model is and What it is Not (WebID: 12838):
In this paper, we present the dual-Dirac model, how and why it is used in specifications, how it is used to estimate the Total Jitter of a system, the assumptions it makes and where they fail. (11 Pages, 55W_21988_0) |
White Paper |
08-Apr-2008 |
Tektronix Solutions for Ultra Wide Band RF Measurements (WebID: 3735):
A quick overview of the Tektronix tools used to address ultra wide-band RF measurements. (61W-19211-5) |
Application Fact Sheets |
03-Apr-2007 |
New Long Record Management Compliance Testing and Analysis Features. (WebID: 4395):
Increase Accuracy, Insight, and Efficiency for TDS6000, TDS7000, and CSA7000 Series Oscilloscopes (4 Pages, 55W-16540-0) |
Application Overview |
10-Jul-2006 |
FFT Applications for TDS (WebID: 2765):
With the aid of practical examples, this paper helps the user understand the theory behind the techniques, to identify the measurements that the FFT can perform, and to set up the oscilloscope for optimum results. (36 Pages, 55W-8815-2) |
Application Note |
24-May-2005 |
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