Total files found 44. Displaying 1 to 10
Sort by
Title |
Sort by
Type |
Sort by
Date  |
SATA Solutions Fact Sheet (WebID: 12499):
This technology fact sheet describes the key elements of SATA Gen-1, Gen-2, and Gen-3 and the Tektronix solution. (55W-21407-4) |
Application Fact Sheets |
12-Oct-2009 |
Tektronix DisplayPort Testing Solution (WebID: 14290):
Tektronix' DisplayPort Testing Solution provides support for Phy layer testing for Sources, Sinks, and Cables (2 Pages, 61W-22852-3) |
Application Fact Sheets |
12-Oct-2009 |
Tektronix USB Testing Solution (WebID: 13182):
Tektronix USB Testing Solution for Electrical Validation & Compliance Test, Signal Path Characterization, Digital Validation & Debug (2 Pages, 55W-17700-5) |
Application Fact Sheets |
12-Oct-2009 |
Tektronix Serial Data Network & Link Analysis Solutions (WebID: 14109):
The Only Integrated Solution Addressing The Complete Multi-Gigabit Serial Data Link (55W-22102-2) |
Application Fact Sheets |
24-Jul-2009 |
Ethernet Compliance Testing Support (WebID: 14289):
Ethernet standards call for a large number of individual tests, which adds up to alot of setup and measurement time. Tektronix provides a patented, cost effective method using an arbitrary waveform generator and an oscilloscope. (61W-23021-2) |
Application Fact Sheets |
19-Jan-2009 |
SATA Compliance Fact Sheet (WebID: 12500):
A short overview of the compliance challenges for the SATA Gen1, Gen2, and Gen3 with Tektronix product recommendations and solutions. (2 Pages, 55W-18700-4) |
Application Fact Sheets |
19-Jan-2009 |
Choose the Right Platform for Your Jitter Measurements (WebID: 4543):
This document will explain some essential jitter terms, and then go on to discuss jitter measurements and the tools best suited for evaluating and quantifying jitter, when working with serial data communication architectures. (11 Pages, 37W-19858-1) |
Technical Brief |
02-Oct-2008 |
TDR Impedance Measurements: A Foundation for Signal Integrity (WebID: 3846):
At today’s high operating frequencies, anything that affects your signal’s rise time, pulse width, timing, jitter or noise content can impact reliability at the system level. (16 Pages, 55W-14601-2) |
Application Fact Sheets |
04-Sep-2008 |
Tektronix Receiver Testing Solution (WebID: 14070):
Receiver poses one of the biggest challenges for designers who need to exercise and characterize emerging devices. (76W-21670-2) |
Application Fact Sheets |
02-Sep-2008 |
A streamlined method of PCI Express interconnect compliance testing (WebID: 14220):
EDN |
Technical Article |
20-Aug-2008 |
 |
|
|
1
2
3
4
5
