The Challenges Posed by Higher Clock Rates and Tighter Timing Margins (WebID: 2385):
This application note shows you a better way to troubleshoot design faults that may be clock or data jitter related. The first half of the note concentrates on simplifying the process of creating clock signals with precise jitter using arbitrary waveform generators. (12 Pages, 76K_14489_0)
Baseband Video Testing With Digital Phosphor Oscilloscopes (WebID: 13148):
This application note demonstrates the use of a Tektronix TDS700D-series Digital Phosphor Oscilloscope to make a variety of common baseband video measurements and examines some of the critical measurement issues. (12 Pages, 55K-12113-0)